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1N5221 MX7536AD LM293ADT IXFH4N KS7314 FMMZ5238 3296Z202 102CA
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For measuring Found Datasheets File :: 24697    Search Time::1.875ms    
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    Panasonic
Part No. 2SK3652
OCR Text ...ns nC nC nC nC C/W C/W Note) measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors. Safe operation area 1 000 IDP 100 t = 100 s ID t= 1 ms t= 10 ms t= 100 ms Non repetitive pulse TC ...
Description Power Device - Power MOS FETs

File Size 74.67K  /  4 Page

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    HC2F100-SN

LEM
Part No. HC2F100-SN
OCR Text ...ce of having different current measuring ranges in the same housing. features open loop transducer using the hall effect low voltage application unipolar + 5 v dc power supply primary current measuring range from 80 a up to 25...
Description AUTOMOTIVE CURRENT TRANSDUCER HC2F100-SN CLIPS

File Size 928.43K  /  5 Page

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    EverLight
Part No. PLR132
OCR Text ...ed By: Chin-Chia Hsu PLR132 measuring Method *Fig.1 measuring Method of Maximum and Minimum Input Power that Receiver Unit Need Control Circuit Standard plastic optic fiber cable Transmitter PLR132 Receiver Unit Optical Power ...
Description Photo link Light Receiver Unit

File Size 129.87K  /  7 Page

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    Panasonic
Part No. 2SD1444A
OCR Text ... V V MHz pF s s s Note) 1. measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors. 2. *: Rank classification Rank hFE2 R 60 to 120 Q 90 to 180 P 130 to 260 Publication date: February...
Description Power Device - Power Transistors - General-Purpose power amplification

File Size 89.15K  /  5 Page

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    PANASONIC[Panasonic Semiconductor]
Part No. MAZ9120H MAZ9100H MAZ9082H MAZ9062H MAZ9068H
OCR Text ...nce Reverse current Note) 1. measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7031 measuring methods for diodes. 2. Electrostatic breakdown voltage: 10 kV Test method: IEC1000-4-2 (C = 150 pF, R = 330 , Contact discharge...
Description For surge absorption circuit

File Size 77.08K  /  3 Page

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    FK3303010L

Panasonic Semiconductor
Part No. FK3303010L
OCR Text ...-source breakdown voltage note: measuring methods are based on japanese industrial standard jis c 7030 measuring methods for transistors. *1 ton , toff measurement circuit ver. eed pf pf ms drain-source on-state resistance pf 23 12 id = 1...
Description Silicon N-channel MOSFET For switching FK350301 in SSSMini3 type package

File Size 284.93K  /  7 Page

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    FK3306010L

Panasonic Semiconductor
Part No. FK3306010L
OCR Text ... v i s e d : 2013 - 08 - 08 measuring methods are based on japanese industrial standard jis c 7030 measuring methods for transistors. *1 turn-on and turn-off test circuit page ns ns ms pf pf pf ? a v ? ? 3 100 100 rl = 300 ? vdd = ...
Description For switching FK350601 in SSSMini3 type package

File Size 363.26K  /  6 Page

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    0603YD105KAT4A 0603ZD225KAT2A

AVX Corporation
Part No. 0603YD105KAT4A 0603ZD225KAT2A
OCR Text ...r/test x5r specification limits measuring conditions operating temperature range -55oc to +85oc temperature cycle chamber capacitance within specified tolerance 2.5% for 50v dc rating freq.: 1.0 khz 10% dissipation factor 3.0% for 25v d...
Description General Purpose Dielectric for Ceramic Capacitors
X5R Dielectric General Specifications

File Size 103.65K  /  4 Page

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    AM417

Analog Devices
Part No. AM417
OCR Text ...rce for the supply of external measuring cells ? output driver (pnp open collector): i out = +11ma ? no limited resolution ? output current limitation ? low internal noise ? integrated emc protection ? small so8 package...
Description Ratiometric instrumentation amplifier with adjustable output stage

File Size 270.94K  /  18 Page

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