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    NX3L1G66GM

NXP Semiconductors
Part No. NX3L1G66GM
OCR Text ...ircuit. fig 4. test circuit for measuring off-state leakage current fig 5. test circuit for measuring on-state leakage current 001aag488 i s i s v i v il v o v cc gnd y z e 001aag489 i s v i v ih v o v cc gnd y z e table 8. on resistance at...
Description Low-voltage analog switch

File Size 105.39K  /  16 Page

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    NX3L1G66GM NX3L1G66GW NX3L1G66GW125

NXP Semiconductors
Part No. NX3L1G66GM NX3L1G66GW NX3L1G66GW125
OCR Text ...ircuit. fig 5. test circuit for measuring off-state leakage current fig 6. test circuit for measuring on-state leakage current 001aag488 i s v i v il v o v cc gnd ny nz ne 001aag489 i s v i v ih v o v cc gnd ny nz ne table 8. on resistanc...
Description Low-ohmic single-pole single-throw analog switch

File Size 177.45K  /  19 Page

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    PANASONIC[Panasonic Semiconductor]
Part No. MA198 MA3X198
OCR Text ...s 1.0 2.0 100 Note) 1. measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7031 measuring methods for diodes. 2. Absolute frequency of input and output is 10 MHz. 3. *: trr measurement circuit Bias Application Unit (...
Description    Silicon epitaxial planar type

File Size 68.12K  /  3 Page

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    MLZ2012M100W MLZ1005 MLZ1608

TDK Electronics
Part No. MLZ2012M100W MLZ1005 MLZ1608
OCR Text ...equipment may be used. type l l measuring conditions dc resistance ( )30% rated current 1 (ma) rated current 2 (ma) part no. (h) tolerance frequency (mhz) current (ma) large current 0.47 20% 2 0.1 0.20 120 500 mlz1005mr47wt 0.68 20% 2...
Description Inductors for Decoupling Circuits Multilayer Ferrite

File Size 330.25K  /  26 Page

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    Panasonic
Part No. 2SD2074
OCR Text ...: base mt-2-a1 package note) 1. measuring methods are based on japanese industrial standard jis c 7030 measuring methods for transistors. 2. * 1: pulse measurement * 3: r on measurement circuit * 2: rank classification rank r s t h fe1 20...
Description Small-signal device - Small-signal transistor - General-use Low-Frequency Amplifires

File Size 81.54K  /  3 Page

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    MA2YD23

Panasonic Semiconductor
Part No. MA2YD23
OCR Text ... 20.0 40.0 A Unit V Note) 1. measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7031 measuring methods for diodes. 2. This product is sensitive to electric shock (static electricity, etc.). Due attention must be paid on th...
Description Silicon epitaxial planar type

File Size 63.67K  /  3 Page

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    18125A103JAT7A 1812XXXX

AVX Corporation
Part No. 18125A103JAT7A 1812XXXX
OCR Text ...temperature for 24 hours before measuring. Step 1: -55C 2 Step 2: Room Temp Step 3: +125C 2 Step 4: Room Temp 30 3 minutes 3 minutes 30 3 minutes 3 minutes Dip device in eutectic solder at 260C for 60 seconds. Store at room temperatur...
Description C0G Dielectric

File Size 321.01K  /  20 Page

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    EverLight
Part No. PLR132
OCR Text ...ed By: Chin-Chia Hsu PLR132 measuring Method *Fig.1 measuring Method of Maximum and Minimum Input Power that Receiver Unit Need Control Circuit Standard plastic optic fiber cable Transmitter PLR132 Receiver Unit Optical Power ...
Description Photo link Light Receiver Unit

File Size 129.87K  /  7 Page

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    DA2DF62

Panasonic Semiconductor
Part No. DA2DF62
OCR Text measuring methods are based on japanese industrial standard jis c 7031 measuring methods for diodes. 2. a bsolute fre q uenc y of in p ut and out p ot is 10 mh z 3. *1 r-load trr test circuit ma g a g ine 50 p cs forward voltage vf elect...
Description Silicon epitaxial planar type For high frequency rectification

File Size 422.22K  /  3 Page

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    Panasonic
Part No. 2SA2067
OCR Text ... Max Unit V A A mA Note) 1. measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors. 2. *: Rank classification Rank hFE1 Q 120 to 250 P 160 to 320 Publication date: January 2003 SJD...
Description Power Device - Power Transistors - General-Purpose power amplification

File Size 72.92K  /  4 Page

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