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For measuring Found Datasheets File :: 24983    Search Time::1.187ms    
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    Panasonic
Part No. 2SD1444A
OCR Text ... V V MHz pF s s s Note) 1. measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors. 2. *: Rank classification Rank hFE2 R 60 to 120 Q 90 to 180 P 130 to 260 Publication date: February...
Description Power Device - Power Transistors - General-Purpose power amplification

File Size 89.15K  /  5 Page

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    PANASONIC[Panasonic Semiconductor]
Part No. MAZ9120H MAZ9100H MAZ9082H MAZ9062H MAZ9068H
OCR Text ...nce Reverse current Note) 1. measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7031 measuring methods for diodes. 2. Electrostatic breakdown voltage: 10 kV Test method: IEC1000-4-2 (C = 150 pF, R = 330 , Contact discharge...
Description For surge absorption circuit

File Size 77.08K  /  3 Page

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    2SA2057

PANASONIC[Panasonic Semiconductor]
Part No. 2SA2057
OCR Text ... Max Unit V A A mA Note) 1. measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors. 2. *: Rank classification Rank hFE1 Publication date: January 2003 Q 120 to 250 P 160 to 320 S...
Description Silicon PNP epitaxial planar type

File Size 72.39K  /  3 Page

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    DA2DF62

Panasonic Semiconductor
Part No. DA2DF62
OCR Text measuring methods are based on japanese industrial standard jis c 7031 measuring methods for diodes. 2. a bsolute fre q uenc y of in p ut and out p ot is 10 mh z 3. *1 r-load trr test circuit ma g a g ine 50 p cs forward voltage vf elect...
Description Silicon epitaxial planar type For high frequency rectification

File Size 422.22K  /  3 Page

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    XC6372E500DL XC6372E500DR XC6372E501DR XC6372E501PR XC6371A500PR XC6371C500DL XC6371C500DR XC6371C500PL XC6371C500PR XC6

TOREX[Torex Semiconductor]
Part No. XC6372E500DL XC6372E500DR XC6372E501DR XC6372E501PR XC6371A500PR XC6371C500DL XC6371C500DR XC6371C500PL XC6371C500PR XC6371C501DL XC6371C501DR XC6371C501PL XC6371C501PR XC6371C502DL XC6371C502DR XC6371C502PL XC6371C502PR XC6373A200DL XC6373A200DR XC6373A200PL XC6373A200PR XC6372E500PL XC6372E500PR XC6372E501DL XC6372E502DL XC6372E502DR XC6372E502PL XC6372E502PR XC6371A500DL XC6371A500DR XC6371A500PL XC6371A501DL XC6371A501DR XC6371A501PL XC6371A502DL XC6371A502DR XC6371A502PL XC6371A502PR XC6373E700PR XC6371 XC6371_1 XC6371A200DL XC6371A200DR XC6371A200PL XC6371A200PR XC6371A201DL XC6371A201DR XC6371A201PL XC6371A201PR XC6371A202DL XC6371A202DR XC6371A202PL XC6371A202PR XC6371A350DL XC6371A350DR XC6371A350PL XC6371A350PR XC6371A351DL XC6371A351DR XC6371A351PL XC6371A351PR XC6371A352DL XC6371A352DR XC6371A352PL XC6371A352PR XC6371A501PR XC6371A700DL XC6371A700DR XC6371A700PL XC6371A700PR XC6371A701DL XC6371A701DR XC6371A701PL XC6371A701PR XC6371A702DL XC6371A702DR XC6371A702PL XC6371A702PR XC6371C200DL XC6371C200DR XC6371C200PL XC6371C200PR XC6371C201DL XC6371C201DR XC6371C201PL XC6371C201PR XC6371C202DL XC6371C202DR XC6371C202PL XC6371C202PR XC6371C350DL XC6371C350DR XC6371C350PL X
OCR Text ...on Frequency FOSC Same as IDD1. measuring of Lx waveform Maximum Duty Ratio MAXDTY Same as IDD1. measuring of Lx waveform PFM Duty Ratio (*4) PFMDTY Same as IDD1. measuring of Lx waveform Same as IDD1. Apply output voltage to Lx, Lx Limit V...
Description    PWM Controlled Step-Up DC/DC Controllers/Converters

File Size 766.59K  /  18 Page

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    2SA2064

PANASONIC[Panasonic Semiconductor]
Part No. 2SA2064
OCR Text ...00 Typ Max Unit V A A Note) measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors. Publication date: January 2003 SJD00285BED 1 2SA2064 PC Ta 35 (1) TC = Ta (2) Without h...
Description Silicon PNP epitaxial planar type

File Size 70.35K  /  3 Page

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    2SA2067

PANASONIC[Panasonic Semiconductor]
Part No. 2SA2067
OCR Text ... Max Unit V A A mA Note) 1. measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors. 2. *: Rank classification Rank hFE1 Q 120 to 250 P 160 to 320 Publication date: January 2003 SJD...
Description Silicon PNP epitaxial planar type

File Size 66.39K  /  3 Page

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    12105C224KAT4A

AVX Corporation
Part No. 12105C224KAT4A
OCR Text ...perature for 24 2 hours before measuring. Store in a test chamber set at 85C 2C/ 85% 5% relative humidity for 1000 hours (+48, -0) with rated voltage applied. Remove from chamber and stabilize at room temperature and humidity for 24 2 h...
Description X7R Dielectric

File Size 320.90K  /  20 Page

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    Panasonic
Part No. 2SA1790J
OCR Text ....0 50 2.0 dB pF Note) 1. measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors. 2. *: Rank classification Rank hFE B 70 to 140 C 110 to 220 0.10 max. (0.375) Publication dat...
Description Small-signal device - Small-signal transistor - High-Frequency Amplifiers and Others

File Size 72.00K  /  4 Page

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