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F7631 CDRH73 X9221AWS FQP16N15 AOW12N60 ST62P55C MMSZ4700 13000
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  surviving Datasheet PDF File

For surviving Found Datasheets File :: 143    Search Time::1.266ms    
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    ST Microelectronics
Part No. TSC102
OCR Text ... 2.8 to 30 v wide common-mode surviving range: -16 to 60 v (reversed battery and load-dump conditions) low current consumption: i cc max = 420 a output amplifier fo r tailor-made signal conditioning -40 to 125 c operating temperatu...
Description High-side current sense amplifier plus signal conditioning amplifier

File Size 639.00K  /  24 Page

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    TSC1031

STMicroelectronics
Part No. TSC1031
OCR Text ...configuration wide common-mode surviving range: -16 to 75 v (reversed battery and load-dump conditions) supply voltage range: 2.7 to 5.5 v in single supply configuration low current consumption: i cc max = 360 a pin selectable gain:...
Description Current Sense Amplifiers

File Size 411.23K  /  23 Page

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    TSC103

STMicroelectronics
Part No. TSC103
OCR Text ...configuration wide common-mode surviving range: -16 to 75 v (reversed battery and load-dump conditions) supply voltage range: 2.7 to 5.5 v in single-supply configuration low current consumption: i cc max = 360 a pin selectable gain:...
Description Current Sense Amplifiers

File Size 391.31K  /  23 Page

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    IRHI7360SE

International Rectifier
Part No. IRHI7360SE
OCR Text ...ese devices are also capable of surviving transient ionization pulses as high as 1 x 10 12 rads (si)/sec, and return to normal opera- tion within a few microseconds. since the see pro- cess utilizes international rectifiers patented hexfe...
Description Simple Drive Requirements
400V 100kRad Hi-Rel Single N-Channel SEE Hardened MOSFET in a TO-259AA package

File Size 34.18K  /  4 Page

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    IRHI7460SE IRHI7460SE-15

International Rectifier
Part No. IRHI7460SE IRHI7460SE-15
OCR Text ...ese devices are also capable of surviving transient ionization pulses as high as 1 x 10 12 rads (si)/sec, and return to normal operation within a few microseconds. since the see process utilizes international rectifiers pat- ented hexfet t...
Description Simple Drive Requirements
500V 100kRad Hi-Rel Single N-Channel SEE Hardened MOSFET in a TO-259AA package

File Size 34.37K  /  4 Page

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    BBF2805SE BBF2815S BBF2812S BBF2805SK BBF2803SH BBF2812SE BBF2803SE BBF2815SE BBF2800S BBF2812SH BBF2815SK BBF2803S BBF2

M.S. Kennedy Corp.
M.S. Kennedy Corporation
Part No. BBF2805SE BBF2815S BBF2812S BBF2805SK BBF2803SH BBF2812SE BBF2803SE BBF2815SE BBF2800S BBF2812SH BBF2815SK BBF2803S BBF2805S
OCR Text ...ll operating temperatures while surviving very high g forces. bbf2800s series standard features include kelvin sense, indefinite short circuit protection, remote shutdown, output fault monitoring, turn on voltage point adjustment, switching...
Description 3.3V, 20W DC-DC converter
15V, 20W DC-DC converter
12V, 20W DC-DC converter
Analog IC
18-Mbit (512K x 36/1M x 18) Pipelined SRAM with NoBL™ Architecture
9-Mbit (256K x 36/512K x 18) Pipelined SRAM with NoBL™ Architecture
18-Mbit QDR™-II SRAM 2-Word Burst Architecture
18-Mbit (512K x 36/1M x 18) Flow-Through SRAM with NoBL™ Architecture
20W DC-DC Converter(输出功率20WDC-DC转换

File Size 162.89K  /  7 Page

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    Amphenol, Corp.
Part No. DHC2805SE DHC2803SE DHC2803SK DHC2803SH
OCR Text ...ll operating temperatures while surviving very high g forces. dhc2800s standard features include output fault monitor- ing and/or turn on voltage point programming via the shut- down pin. all three functions may be implemented simulta- neou...
Description Analog IC 模拟IC

File Size 163.03K  /  6 Page

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    JANSF2N7424U JANSR2N7424U

International Rectifier
Part No. JANSF2N7424U JANSR2N7424U
OCR Text ...e devices are also ca- pable of surviving transient ionization pulses as high as 1 x 10 12 rads (si)/sec, and return to normal operation within a few microseconds. single event effect (see) testing of in- ternational rectifier p-channel r...
Description HEXFET Transistor(HEXFET 晶体

File Size 133.04K  /  8 Page

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    IRHF7310SE

International Rectifier
Part No. IRHF7310SE
OCR Text ...ese devices are also capable of surviving transient ionization pulses as high as 1 x 10 12 rads (si)/sec, and return to normal opera- tion within a few microseconds. since the see pro- cess utilizes international rectifiers patented hexfe...
Description N-Channel Single Event Effect (SEE) Rad Hard HEXFET Transistor(N 沟道 单事件效Rad Hard HEXFET技术晶体管)

File Size 36.02K  /  4 Page

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