LSRFVG3393 doc. no : qw0905- rev. : date : 19 - jul. a - 2005 data sheet LSRFVG3393 dual color led lamps ligitek electronics co.,ltd. property of ligitek only
directivity radiation note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. LSRFVG3393 package dimensions part no. ligitek electronics co.,ltd. property of ligitek only page 1/5 srf vg - 2 + 1 + 3 1.anode green 2.common cathode 3.anode red 8.6 7.6 10.5 ? 0.5 1.5 max 2.0min 2.54typ 2.0min 2.54typ 1 2 3 ?? 0.5 typ 18.0min 5.9 5.0 60 x 30 x 0 x 0 25% 50% 75% 100% -30 x -60 x 100% 75% 50% 25%
i f forward current 30 ma 30 power dissipation peak forward current duty 1/10@10khz reverse current @5v storage temperature soldering temperature part no typical electrical & optical characteristics (ta=25 j ) note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. LSRFVG3393 operating temperature spectral halfwidth ??f nm 20 30 color white diffused algainp gap red green material emitted ---- 565 ---- 630 peak wave length f pnm lens dominant wave length f dnm 2.4 2.6 1.5 1.7 550 160 900 300 forward voltage @20ma(v) max. min. luminous intensity @20ma(mcd) min. typ. 40 40 viewing angle 2 c 1/2 (deg) -40 ~ +100 max 260 j for 5 sec max (2mm from body) -40 ~ +85 tsol tstg t opr pd ir i fp 75 90 ma mw g a j j 120 100 10 absolute maximum ratings at ta=25 j part no. ratings ligitek electronics co.,ltd. property of ligitek only parameter LSRFVG3393 symbol srf unit page vg 2/5 electrostatic discharge esd 2000 v ----
ambient temperature( j ) fig.3 forward voltage vs. temperature forward voltage@20ma normalize @25 j -40 0.8 -20 20 04060 0.9 1.0 1.2 1.1 fig.4 relative intensity vs. temperature ambient temperature( j ) relative intensity@20ma normalize @25 j 0.0 80 100 -40 -20 020 3.0 2.5 2.0 1.0 1.5 0.5 100 60 40 80 typical electro-optical characteristics curve fig.1 forward current vs. forward voltage srf chip forward current(ma) forward voltage(v) 0.1 1.0 2.0 1.0 10 3.0 4.0 100 1000 forward current(ma) fig.2 relative intensity vs. forward current relative intensity normalize @20ma 1.5 1.0 0.5 0.0 5.0 1.0 10 3.0 2.5 2.0 100 1000 ligitek electronics co.,ltd. property of ligitek only fig.5 relative intensity vs. wavelength relative intensity@20ma wavelength (nm) 600 550 0.0 0.5 650 1.0 700 part no. LSRFVG3393 3/5 page
fig.3 forward voltage vs. temperature fig.5 relative intensity vs. wavelength ambient temperature( j ) relative intensity@20ma wavelength (nm) forward voltage@20ma normalize @25 j fig.4 relative intensity vs. temperature ambient temperature( j ) relative intensity@20ma normalize @25 j typical electro-optical characteristics curve forward voltage(v) fig.1 forward current vs. forward voltage forward current(ma) forward current(ma) fig.2 relative intensity vs. forward current relative intensity normalize @20ma ligitek electronics co.,ltd. property of ligitek only 1.0 0.1 1.0 10 100 1000 1.0 10 100 1000 0.0 0.5 1.0 1.5 2.0 2.5 3.0 -40 -20 0 20 40 60 1.0 1.1 1.2 500 550 600 650 0.0 0.5 1.0 2.0 3.0 4.0 5.0 80 100 0.8 0.9 -20 -40 40 20 080100 60 2.0 0.0 0.5 1.0 1.5 2.5 3.0 vg chip 3.5 part no. LSRFVG3393 4/5 page
mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) operating life test this test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. solder resistance test solderability test thermal shock test low temperature storage test high temperature high humidity test high temperature storage test the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. this test intended to see soldering well performed or not. this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. the purpose of this test is the resistance of the device under tropical for hous. 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 jis c 7021: b-12 mil-std-202:103b jis c 7021: b-11 mil-std-883:1008 jis c 7021: b-10 ligitek electronics co.,ltd. property of ligitek only LSRFVG3393 reliability test: test item part no. test condition description reference standard page 5/5
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