1 overview the an7900t/an7900f series is 3-pin fixed negative output type monolithic voltage regulators. a stabilized fixed negative output voltage is obtained from an unstable dc input voltage without using any external parts. eleven types of fixed output voltage are available from C5v through C10v, C12v, C15v, C18v, C20v, and C24v. they can be used widely as power circuits with a current capacitance of up to 1a. features ? no external components ? output voltage : C5v, C6v, C7v, C8v, C9v, C10v, C12v, C15v, C18v, C20v, C24v ? overcurrent limit circuit built-in ? thermal over-load protection built-in ? area of safe operation (aso) circuit built-in an7900t/an7900f series 3-pin negative output voltage regulators (1a type) block diagram 1 3 2 common output input starter voltage reference error amp. + C r 1 q 1 pass tr. r sc current limiter thermal protection r 2 unit : mm an7900f series 16.7 0.3 17.0 0.25 4.2 0.25 3.8 0.25 8.7 0.3 13.6 0.25 4.5 0.25 1.4 0.2 to-220 full pack package (hsip003-p-0000a) 10.5 0.3 2.77 0.3 (1.73) 123 ?5.3 ?3.1 0.1 (4.3) 2.5 0.25 4.5 0.3 1 : common ,16 3 : output 2.0 0.25 0.8 0.2 (0.4) 2.54 0.4 +0.1 C 0.05 unit : mm an7900t series 10.4 0.5 1.4 0.1 2.9 0.1 6.7 0.25 8.7 0.3 13.6 0.25 1.4 0.25 4.5 ?3.7 10.5 0.5 2.54 0.45 1 : common ,16 3 : output 2.5 0.25 +0.1 C 0.05 123 4.5 0.3 jedec: to-220ab (hsip003-p-0000) 0.8 0.2
2 v i p d t opr t stg v v w ?c ?c C35 * 1 C40 * 2 15 * 3 10.25 * 3 C30 to +80 C55 to +150 input voltage power dissipation operating ambient temperature storage temperature an7900t series an7900f series * 1 an7905t/f, an7906t/f, an7907t/f, an7908t/f, an7909t/f, an7910t/f, an7912t/f, an7915t/f, AN7918T/f * 2 an7920t/f, an7924t/f * 3 follow the derating curve. when t j exceeds 150?c, the internal circuit shuts off the output. parameter symbol rating unit absolute maximum ratings (ta = 25?c) typ output voltage v o C5.2 v C5 output voltage tolerance v o v v i = C7 to C20v, i o = 5ma to 1a, p d * line regulation reg in 100 mv 3 v i = C7 to C25v, t j = 25?c mv load regulation reg l mv 10 i o = 5ma to 1.5a, t j = 25?c mv i o = 250 to 750ma, t j = 25?c v i = C8 to C12v, t j = 25?c ma 2 t j = 25?c 1 bias current i bias ma v i = C7 to C25v, t j = 25?c input bias fluctuation ma load bias current fluctuation v 40 i o = 5ma to 1a, t j = 25?c output noise voltage v no db f = 10hz to 100khz, ta = 25?c 1.3 0.5 50 C5.25 100 50 4 62 C4.8 C4.75 ripple rejection ratio rr v i = C8 to C18v, i o = 100ma, f = 120hz v 1.1 i o = 1a, t j = 25?c minimum i/o voltage difference a 2.1 3 74 peak output current C 0.4 output voltage temperature coefficient parameter symbol condition min max unit t j = 25?c i o = 5ma, t j = 0 to 125?c t j = 25?c ? i bias (in) ? i bias (l) v dif (min.) i o (peak) mv/?c ? v o /ta note 1) the specified condition t j = 25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) unless otherwise specified, v i = C10v, i o = 500ma, c i = 2 f, c o = 1 f, t j = 0 to 125?c * an7900t series : 15w, an7900f series : 10.25w electrical characteristics (ta = 25?c) ? an7905t/an7905f (C5v type) < =
3 v o C6.25 v C6 v o v reg in 120 mv 4 mv reg l mv 10 mv ma 2 1.5 i bias ma ma 44 v no db 1.3 0.5 60 C6.3 120 60 4 60 C5.75 C5.7 rr v 1.1 a 2.1 3 73 C 0.5 typ output voltage output voltage tolerance line regulation load regulation bias current input bias fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum i/o voltage difference peak output current output voltage temperature coefficient parameter symbol condition min max unit v i = C8 to C21v, i o = 5ma to 1a, p d * v i = C8 to C25v, t j = 25?c i o = 5ma to 1.5a, t j = 25?c i o = 250 to 750ma, t j = 25?c v i = C9 to C13v, t j = 25?c t j = 25?c v i = C8 to C25v, t j = 25?c v i o = 5ma to 1a, t j = 25?c f = 10hz to 100khz, ta = 25?c v i = C9 to C19v, i o = 100ma, f = 120hz i o = 1a, t j = 25?c t j = 25?c i o = 5ma, t j = 0 to 125?c t j = 25?c ? i bias (in) ? i bias (l) v dif (min.) i o (peak) mv/?c ? v o /ta note 1) the specified condition t j = 25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) unless otherwise specified, v i = C11v, i o = 500ma, c i = 2 f, c o = 1 f, t j = 0 to 125?c * an7900t series : 15w, an7900f series : 10.25w electrical characteristics (ta = 25?c) (continued) ? an7906t/an7906f (C6v type) < = v o C7.3 v C7 v o v reg in 140 mv 5 mv reg l mv 12 mv ma 2 1.5 i bias ma ma 48 v no db 1.3 0.5 70 C7.35 140 70 4 58 C6.7 C6.65 rr v 1.1 a 2.1 4 72 C 0.5 typ output voltage output voltage tolerance line regulation load regulation bias current input bias fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference peak output current output voltage temperature coefficient parameter symbol condition min max unit v i = C79 to C22v, i o = 5ma to 1a, p d * v i = C9 to C25v, t j = 25?c i o = 5ma to 1.5a, t j = 25?c i o = 250 to 750ma, t j = 25?c v i = C10 to C14v, t j = 25?c t j = 25?c v i = C9 to C25v, t j = 25?c v i o = 5ma to 1a, t j = 25?c f = 10hz to 100khz, ta = 25?c v i = C10 to C20v, i o = 100ma, f = 120hz i o = 1a, t j = 25?c t j = 25?c i o = 5ma, t j = 0 to 125?c t j = 25?c ? i bias (in) ? i bias (l) v dif (min.) i o (peak) mv/?c ? v o /ta note 1) the specified condition t j = 25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) unless otherwise specified, v i = C12v, i o = 500ma, c i = 2 f, c o = 1 f, t j = 0 to 125?c * an7900t series : 15w, an7900f series : 10.25w ? an7907t/an7907f (C7v type) < =
4 v o C8.3 v C8 v o v reg in 160 mv 6 mv reg l mv 12 mv ma 2.2 2 i bias ma ma 52 v no db 1 0.5 80 C8.4 160 80 4.5 56 C7.7 C7.6 rr v 1.1 a 2.1 4 71 C 0.6 typ output voltage output voltage tolerance line regulation load regulation bias current input bias fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference peak output current output voltage temperature coefficient parameter symbol condition min max unit v i = C10 to C23v, i o = 5ma to 1a, p d * v i = C10.5 to C25v, t j = 25?c i o = 5ma to 1.5a, t j = 25?c i o = 250 to 750ma, t j = 25?c v i = C11 to C17v, t j = 25?c t j = 25?c v i = C10.5 to C25v, t j = 25?c v i o = 5ma to 1a, t j = 25?c f = 10hz to 100khz, ta = 25?c v i = C11 to C21v, i o = 100ma, f = 120hz i o = 1a, t j = 25?c t j = 25?c i o = 5ma, t j = 0 to 125?c t j = 25?c ? i bias (in) ? i bias (l) v dif (min.) i o (peak) mv/?c ? v o /ta note 1) the specified condition t j = 25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) unless otherwise specified, v i = C14v, i o = 500ma, c i = 2 f, c o = 1 f, t j = 0 to 125?c * an7900t series : 15w, an7900f series : 10.25w electrical characteristics (ta = 25?c) (continued) ? an7908t/an7908f (C8v type) < = v o C9.35 v C9 v o v reg in 180 mv 7 mv reg l mv 12 mv ma 2.2 2 i bias ma ma 58 db 1 0.5 90 C9.45 180 90 4.5 56 C8.65 C8.55 rr v 1.1 a 2.1 4 71 C0.6 typ output voltage tolerance input bias fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference peak output current output voltage temperature coefficient parameter symbol condition min max unit output voltage line regulation load regulation bias current v no v i = C11.5 to C24v, i o = 5ma to 1a, p d * v i = C11.5 to C26v, t j = 25?c i o = 5ma to 1.5a, t j = 25?c i o = 250 to 750ma, t j = 25?c v i = C12 to C18v, t j = 25?c t j = 25?c v i = C11.5 to C26v, t j = 25?c v i o = 5ma to 1a, t j = 25?c f = 10hz to 100khz, ta = 25?c v i = C12 to C22v, i o = 100ma, f = 120hz i o = 1a, t j = 25?c t j = 25?c i o = 5ma, t j = 0 to 125?c t j = 25?c ? i bias (in) ? i bias (l) v dif (min.) i o (peak) mv/?c ? v o /ta note 1) the specified condition t j = 25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) unless otherwise specified, v i = C15v, i o = 500ma, c i = 2 f, c o = 1 f, t j = 0 to 125?c * an7900t series : 15w, an7900f series : 10.25w ? an7909t/an7909f (C9v type) < =
5 v o C10.4 v C10 v o v reg in 200 mv 8 mv reg l mv 12 mv ma 2.5 2.5 i bias ma ma 64 v no db 1 0.5 100 C10.5 200 100 5 56 C9.6 C9.5 rr v 1.1 a 2.1 4 71 C 0.7 typ output voltage output voltage tolerance line regulation load regulation bias current input bias fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference peak output current output voltage temperature coefficient parameter symbol condition min max unit v i = C12.5 to C25v, i o = 5ma to 1a, p d * v i = C12.5 to C27v, t j = 25?c i o = 5ma to 1.5a, t j = 25?c i o = 250 to 750ma, t j = 25?c v i = C13 to C19v, t j = 25?c t j = 25?c v i = C12.5 to C27v, t j = 25?c v i o = 5ma to 1a, t j = 25?c f = 10hz to 100khz, ta = 25?c v i = C13 to C23v, i o = 100ma, f = 120hz i o = 1a, t j = 25?c t j = 25?c i o = 5ma, t j = 0 to 125?c t j = 25?c ? i bias (in) ? i bias (l) v dif (min.) i o (peak) mv/?c ? v o /ta note 1) the specified condition t j = 25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) unless otherwise specified, v i = C16v, i o = 500ma, c i = 2 f, c o = 1 f, t j = 0 to 125?c * an7900t series : 15w, an7900f series : 10.25w electrical characteristics (ta = 25?c) (continued) ? an7910t/an7910f (C10v type) < = v o C12.5 v C12 v o v reg in 240 mv 10 mv reg l mv 12 mv ma 2.5 3 i bias ma ma 75 v no db 1 0.5 120 C12.6 240 120 5 55 C11.5 C11.4 rr v 1.1 a 2.1 4 70 C 0.8 typ output voltage output voltage tolerance line regulation load regulation bias current input bias fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference peak output current output voltage temperature coefficient parameter symbol condition min max unit v i = C14.5 to C27v, i o = 5ma to 1a, p d * v i = C14.5 to C30v, t j = 25?c i o = 5ma to 1.5a, t j = 25?c i o = 250 to 750ma, t j = 25?c v i = C16 to C22v, t j = 25?c t j = 25?c v i = C14.5 to C30v, t j = 25?c v i o = 5ma to 1a, t j = 25?c f = 10hz to 100khz, ta = 25?c v i = C15 to C25v, i o = 100ma, f = 120hz i o = 1a, t j = 25?c t j = 25?c i o = 5ma, t j = 0 to 125?c t j = 25?c ? i bias (in) ? i bias (l) v dif (min.) i o (peak) mv/?c ? v o /ta note 1) the specified condition t j = 25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) unless otherwise specified, v i = C19v, i o = 500ma, c i = 2 f, c o = 1 f, t j = 0 to 125?c * an7900t series : 15w, an7900f series : 10.25w ? an7912t/an7912f (C12v type) < =
6 v o C15.6 v C15 v o v reg in 300 mv 11 mv reg l mv 12 mv ma 2.5 3 i bias ma ma 90 v no db 1 0.5 150 C15.75 300 150 5 54 C14.4 C14.25 rr v 1.1 a 2.1 4 69 C0.9 typ output voltage output voltage tolerance line regulation load regulation bias current input bias fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference peak output current output voltage temperature coefficient parameter symbol condition min max unit v i = C17.5 to C30v, i o = 5ma to 1a, p d * v i = C17.5 to C30v, t j = 25?c v i = C20 to C26v, t j = 25?c v i = C17.5 to C30v, t j = 25?c v v i = C18.5 to C28.5v, i o = 100ma, f = 120hz ? i bias (in) ? i bias (l) v dif (min.) i o (peak) mv/?c ? v o /ta note 1) the specified condition t j = 25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) unless otherwise specified, v i = C23v, i o = 500ma, c i = 2 f, c o = 1 f, t j = 0 to 125?c * an7900t series : 15w, an7900f series : 10.25w electrical characteristics (ta = 25?c) (continued) ? an7915t/an7915f (C15v type) < = i o = 5ma to 1.5a, t j = 25?c i o = 250 to 750ma, t j = 25?c t j = 25?c i o = 5ma to 1a, t j = 25?c f = 10hz to 100khz, ta = 25?c i o = 1a, t j = 25?c t j = 25?c i o = 5ma, t j = 0 to 125?c t j = 25?c v o C18.7 v C18 v o v reg in 360 mv 15 mv reg l mv 12 mv ma 2.5 5 i bias ma ma 110 v no db 1 0.5 180 C18.9 360 180 5 53 C17.3 C17.1 rr v 1.1 a 2.1 4 68 C1 typ output voltage output voltage tolerance line regulation load regulation bias current input bias fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference peak output current output voltage temperature coefficient parameter symbol condition min max unit v i = C21 to C33v, i o = 5ma to 1a, p d * v i = C21 to C33v, t j = 25?c i o = 5ma to 1.5a, t j = 25?c i o = 250 to 750ma, t j = 25?c v i = C24 to C30v, t j = 25?c t j = 25?c v i = C21 to C33v, t j = 25?c v i o = 5ma to 1a, t j = 25?c f = 10hz to 100khz, ta = 25?c v i = C22 to C32v, i o = 100ma, f = 120hz i o = 1a, t j = 25?c t j = 25?c i o = 5ma, t j = 0 to 125?c t j = 25?c ? i bias (in) ? i bias (l) v dif (min.) i o (peak) mv/?c ? v o /ta note 1) the specified condition t j = 25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) unless otherwise specified, v i = C27v, i o = 500ma, c i = 2 f, c o = 1 f, t j = 0 to 125?c * an7900t series : 15w, an7900f series : 10.25w ? AN7918T/an7918f (C18v type) < =
7 v o C20.8 v C20 v o v reg in 400 mv 16 mv reg l mv 12 mv ma 3 5.5 i bias ma ma 135 v no db 1 0.5 200 C21 400 200 5 52 C19.2 C19 rr v 1.1 a 2.1 4 67 C1 typ output voltage output voltage tolerance line regulation load regulation bias current input bias fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference peak output current output voltage temperature coefficient electrical characteristics (ta = 25?c) (continued) parameter symbol condition min max unit v i = C23 to C35v, i o = 5ma to 1a, p d * v i = C23 to C35v, t j = 25?c i o = 5ma to 1.5a, t j = 25?c i o = 250 to 750ma, t j = 25?c v i = C26 to C32v, t j = 25?c t j = 25?c v i = C23 to C35v, t j = 25?c v i o = 5ma to 1a, t j = 25?c f = 10hz to 100khz, ta = 25?c v i = C24 to C34v, i o = 100ma, f = 120hz i o = 1a, t j = 25?c t j = 25?c i o = 5ma, t j = 0 to 125?c t j = 25?c ? i bias (in) ? i bias (l) v dif (min.) i o (peak) mv/?c ? v o /ta note 1) the specified condition t j = 25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) unless otherwise specified, v i = C29v, i o = 500ma, c i = 2 f, c o = 1 f, t j = 0 to 125?c * an7900t series : 15w, an7900f series : 10.25w ? an7920t/an7920f (C20v type) < = v o C25 v C24 v o v reg in 480 mv 18 mv reg l mv 12 mv ma 3 6 i bias ma ma 170 v no db 1 0.5 240 C25.2 480 240 5 50 C23 C22.8 rr v 1.1 a 2.1 4 65 C1 typ output voltage output voltage tolerance line regulation load regulation bias current input bias fluctuation load bias current fluctuation output noise voltage ripple rejection ratio minimum input/output voltage difference peak output current output voltage temperature coefficient parameter symbol condition min max unit v i = C27 to C38v, i o = 5ma to 1a, p d * v i = C27 to C38v, t j = 25?c i o = 5ma to 1.5a, t j = 25?c i o = 250 to 750ma, t j = 25?c v i = C30 to C36v, t j = 25?c t j = 25?c v i = C27 to C38v, t j = 25?c v i o = 5ma to 1a, t j = 25?c f = 10hz to 100khz, ta = 25?c v i = C28 to C38v, i o = 100ma, f = 120hz i o = 1a, t j = 25?c t j = 25?c i o = 5ma, t j = 0 to 125?c t j = 25?c ? i bias (in) ? i bias (l) v dif (min.) i o (peak) mv/?c ? v o /ta note 1) the specified condition t j = 25?c means that the test should be carried out with the test time so short (within 10ms) that the drift in characteristic value due to the rise in chip junction temperature can be ignored. note 2) unless otherwise specified, v i = C33v, i o = 500ma, c i = 2 f, c o = 1 f, t j = 0 to 125?c * an7900t series : 15w, an7900f series : 10.25w ? an7924t/an7924f (C24v type) < =
8 120 100 80 60 40 20 0 10 100 an7905t/f i o = 100ma 1k 10k 100k frequency f (hz) ripple rejection ratio rr (db) rrC f 16 14 12 10 8 6 4 2 0 0 40 80 120 160 ambient temperature ta (?c) power dissipation p d (w) p d Cta (an7900f series) 1.4 1.2 1.0 0.8 0.6 0.4 C50 0 50 100 150 junction temperature t j (?c) minimum i/o voltage difference v dif (min.) (v) v dif (min.) Ct j i o = 1000ma i o = 5 0 0 m a i o = 200ma i o = 2 0 m a 0246810 10 0 C10 C20 20 15 10 5 output voltage fluctuation (mv) input voltage v i (v) input transient response an7905t/f 0 1020304050 1 0 C1 C2 2 1 0 output voltage fluctuation (v) load current i o (a) load transient response an7905t/f 16 14 12 10 8 6 4 2 0 0 40 80 120 160 ambient temperature ta (?c) power dissipation p d (w) (1) infinite heat sink (2) 5?c/w heat sink (3) 15?c/w heat sink (4) no heat sink (1) infinite heat sink (2) 5?c/w heat sink (3) 15?c/w heat sink (4) no heat sink (1) (2) (3) (4) (1) (2) (3) (4) time t ( s) time t ( s) p d Cta (an7900t series) basic regulator circuit application circuit Cv o Cv o 2 f 1 f Cv i i o i bias 6 ? q 1 an7900t an7900f an7900t an7900f 2 1 3 2 3 1 r 2 r 1 v o Cv i |v o | = v o + i bias + r 1 r 2 v o C + C + 2 f 1 f C + C + 1) current bootstrap circuit 2) adjustable output regulator characteristic curve c i : required when the input line is long c o : improves the transient response. c o c i input output an7900t an7900f common 2 3 1 C + C +
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