2n2920dcsm?qr?b prelim.11/98 semelab plc. telephone +44(0)1455 556565. fax +44(0)1455 552612. e-mail: sales@semelab.co.uk website: http://www.semelab.co.uk dual npn transistors in a hermetically sealed ceramic surface mount package for high reliability applications features hermetic ceramic surface mount package built & screened in accordance with cecc fulll assessment level and squence b applications: suitable for use in general purpose differential amplifier applications. v cbo collector ? base voltage v ceo collector ? emitter voltage 1 v ebo emitter ? base voltage i c collector current p d total device dissipation derate above 25c t stg storage temperature range 60v 60v 5v 50ma 300mw 500mw 1.72mw / c 2.86mw / c ?65 to 200c mechanical data dimensions in mm (inches) lcc2 package underside view absolute maximum ratings (t amb = 25c unless otherwise stated) pad 1 ? collector 1 pad 2 ? base 1 pad 3 ? base 2 pad 4 ? collector 2 pad 5 ? emitter 2 pad 6 ? emitter 1 a 2 1 3 4 5 6 6.22 0.13 (0.245 0.005) 2.54 ?0.13 (0.10 ?0.005) 1.65 0.13 (0.065 0.005) 2.29 0.20 (0.09 0.008) 1.27 0.13 (0.05 0.005) 1.40 0.15 (0.055 0.006) 4.32 0.13 (0.170 0.005) 0.64 ?0.08 (0.025 ?0.003) 0.23 (0.009) rad. a = notes 1. base ? emitter diode open circuited. each side total device
2n2920dcsm ? qr ? b prelim.11/98 semelab plc. telephone +44(0)1455 556565. fax +44(0)1455 552612. e-mail: sales@semelab.co.uk website: http://www.semelab.co.uk parameter test conditions 1 min. typ. max. unit v na m a na ? v v k w ? m mho ? pf 60 60 5 10 10 20 100 150 450 75 150 450 150 450 125 ? 0.7 ? 0.7 ? 0.8 ? 0.2 ? 0.25 330 150 600 25 x 10 -4 560 1 15 4 8 v (br)cbo collector ? base breakdown voltage v (br)ceo* collector ? emitter breakdown voltage v (br)ebo emitter ? base breakdown voltage i cbo collector cut-off current i ebo emitter cut-off current h fe dc current gain v be base ? emitter voltage v ce(sat) collector ? emitter saturation voltage h ie small signal common ? emitter input impedance h fe small signal common ? emitter current gain h re small signal common ? emitter reverse voltage gain h oe small signal common ? emitter output admittance |h fe | small signal common ? emitter current gain c obo common ? base open circuit output capacitance c ibo common ? base open circuit input capacitance i c = ? 10 m ai e = 0 i c = ? 10ma i b = 0 i e = ? 10 m ai c = 0 v cb = ? 50v i e = 0 t a = 150 c v eb = ? 4v i c = 0 i c = 10 m av ce = 5v i c = ? 100 m av ce = 5v t a = ? 55 c i c = ? 500 m av ce = ? 5v i c = ? 1ma v ce = ? 5v i c = ? 10ma v ce = ? 5v * i c = ? 100 m av ce = ? 5v i b = ? 10 m ai c = ? 100 m a i b = ? 100 m ai c = ? 1ma i b = ? 10 m ai c = ? 100 m a i b = ? 100 m ai c = ? 1ma v ce = ? 10v i c = ? 1ma f = 1khz v ce = ? 5v i c = ? 500 m a f = 30mhz v ce = ? 5v i c = ? 1ma f = 100mhz v cb = ? 5v i e = 0 f = 100khz v eb = ? 0.5v i c = 0 f = 100khz electrical characteristics (t amb = 25 c unless otherwise stated) notes * pulse test: t p = 300 m s, d 2%. 1) terminals not under test are open circuited under all test conditions. individual transistor characteristics
2n2920dcsm ? qr ? b prelim.11/98 semelab plc. telephone +44(0)1455 556565. fax +44(0)1455 552612. e-mail: sales@semelab.co.uk website: http://www.semelab.co.uk electrical characteristics (t amb = 25 c unless otherwise stated) notes 1) terminals not under test are open circuited under all test conditions. 2) the lower of the two readings is taken as h fe1 . 3) average noise figure is measured in an amplifier with response down 3db at 10hz and 10 khz and a high frequency rolloff of 6db / octave. parameter test conditions min. typ. max. unit ? mv mv 0.9 1 5 3 0.8 1 h fe1 static forward current gain h fe2 balance ratio |v be1 ? v be2 | base ? emitter voltage differential | d (v be1 ? v be2 ) d t a | base ? emitter voltage differential v ce = ? 5v i c = ? 100 m a see note 2. v ce = ? 5v i c = ? 10 m a to ? 10ma v ce = ? 5v i c = ? 100 m a v ce = ? 5v i c = ? 100 m a t a1 = 25 ct a2 = ? 55 c v ce = ? 5v i c = ? 100 m a t a1 = 25 ct a2 = 125 c transistor matching characteristics operating characteristics (t amb = 25 c unless otherwise stated) parameter test conditions 1 min. typ. max. unit db db 7 3 2.5 3.5 f spot noise figure _ f average noise figure v ce = ? 10v i c = ? 100 m a r g = 3k w f = 100hz noise bandwidth = 20hz v ce = ? 10v i c = ? 100 m a r g = 3k w f = 1khz noise bandwidth = 200hz v ce = ? 10v i c = ? 100 m a r g = 3k w f = 10khz noise bandwidth = 2khz v ce = ? 10v i c = ? 100 m a r g = 3k w noise bandwidth = 15.7khz see note 3. individual transistor characteristics
2n2920dcsm ? qr ? b prelim.11/98 semelab plc. telephone +44(0)1455 556565. fax +44(0)1455 552612. e-mail: sales@semelab.co.uk website: http://www.semelab.co.uk thermal information 0 25 50 75 100 125 150 175 200 0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 t free air temperature (?c) a p maximum continuous dissipation (w) t total device each transistor
2n2920dcsm ? qr ? b prelim.11/98 semelab plc. telephone +44(0)1455 556565. fax +44(0)1455 552612. e-mail: sales@semelab.co.uk website: http://www.semelab.co.uk s2 2.5 s4 4 see c2c s3 2.5 s4 2.5 s4 2.5 see c5 s4 1.5 see c8 unless otherwise stated in detail specification: attributes information for b3 b4 b5 b8 examination or test sub-group b1 dimensions sub-group b2c verification of ratings sub-group b3 lead bending if applicable sub-group b4 solderability sub-group b5 change of temp followed by acc. damp heat or sealing. sub-group b8 electrical endurance sub-group ctr levels of quality assessment level f il aql notes group b ? lot by lot inspection il = inspection level amb = ambient rated case = case rated aql in (%) c = acceptance criterion n = sample size i 0.65 ii 0.15 primary dc charateristics ii 0.65 if < 4 tests ii 1.0 if 3 4 tests other dc charateristics i 2.5 if < 4 tests i 4 if 3 4 tests ac characteristics s4 4 if < 4 tests s4 6.5 if 3 4 tests inspection level for cecc fully assessed devices - level f examination or test sub-group a1 visual inspection sub-group a2a non operatives sub-group a2b electrical measurements sub-group a3 electrical measurements sub-group a4 electrical measurements levels of quality assessment level f observations il aql notes group a ? lot by lot inspection il = inspection levels aql = acceptable quality level (%)
2n2920dcsm ? qr ? b prelim.11/98 semelab plc. telephone +44(0)1455 556565. fax +44(0)1455 552612. e-mail: sales@semelab.co.uk website: http://www.semelab.co.uk 8/1 13/1 18/1 13/1 when not in b2c 8/1 18/1 na see b5 8/1 18/1 43/3 amb 34/2 case 43/3 amb 34/2 case unless otherwise stated in detail specification: attributes information for c3, c5, c6, c9. measurement inofrmation before and after c8 examination or test sub-group c1 dimensions sub-group c2a electrical measurements sub-group c2b complementary characteristics sub-group c2c verification of ratings sub-group c3 tensile / torque (if applicable) sub-group c4 soldering heat sub-group c5 change of temp followed by acc. damp heat or sealing. sub-group c6 shock acceleration vibration sub-group c7 damp heat (if applicable) sub-group c8 electrical endurance sub-group c9 storage at high temp sub-group ctr levels of quality assessment f (p= 3 months) n/c notes group c ? periodic inspection p = periodicity (months) na = not applied
2n2920dcsm ? qr ? b prelim.11/98 semelab plc. telephone +44(0)1455 556565. fax +44(0)1455 552612. e-mail: sales@semelab.co.uk website: http://www.semelab.co.uk sequence b 24 hour high temperature storage rapid change of temperature acceleration test fine & gross leak test test electrical characteristics test electrical characteristics 72 hour burn-in electrical operation (ambient rated) or high temperature reverse bias (case rated) screening according to cecc sequence b
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