ligitek electronics co.,ltd. property of ligitek only data sheet LUR9653H-30B-WJ doc. no : qw0905-lur 9653h-30b-wj rev. : c date : 13 - oct. - 2006 square with 4leads type led lamps pb lead-free parts
anode cathode c1.25 r0.7 ligitek electronics co.,ltd. property of ligitek only page 1/6 package dimensions part no. LUR9653H-30B-WJ 30 x 60 x 75% 100% 25% 50% -30 x directivity radiation 0 25% 75% 50% 100% -60 x 0 x note : 1.all dimension are in millimeter tolerance is ? 0.25mm unless otherwise noted. 2.specifications are subject to change without notice. 4.4 ? 0.5 3.5 ? 0.5 2.5 ? 0.5 5.08 ? 0.3 0.4 1.55 5.08 0.5 7.62 ? 0.5 r 3.0 7.62 ? 0.5 1.9
note : 1.the forward voltage data did not including ? 0.1v testing tolerance. 2. the luminous intensity data did not including ? 15% testing tolerance. typical electrical & optical characteristics (ta=25 j ) absolute maximum ratings at ta=25 j material part no algainp/gap LUR9653H-30B-WJ water clear red emitted lens color storage temperature operating temperature tstg t opr pd power dissipation reverse current @5v electrostatic discharge( * ) esd ir peak forward current duty 1/10@10khz forward current i fp i f parameter symbol spectral halfwidth ??f nm forward voltage @70ma(v) viewing angle 2 c 1/2 (deg) dominant wave length f dnm 630 2.3 20 min. 5.8 3.5 3.2 70 typ. max. min. -40 ~ +100 -40 ~ +85 j j page 2/6 mw 130 2000 10 v g a 100 70 ma ma ur(h) ratings unit ligitek electronics co.,ltd. property of ligitek only static electricity or power surge will damage the led. use of a c onductive wrist band or anti-electrosatic glove is recommended when handing these led. all devices, equipment and machinery must be properly grounded. * part no. LUR9653H-30B-WJ luminous flux @70ma(lm)
ligitek electronics co.,ltd. property of ligitek only part no. LUR9653H-30B-WJ page 3/6 * luminous flux measurement allowance is 10% max. 3.8 4.9 8.2 6.3 rank f13 rank f15 luminous flux 4.9 rank f14 6.3 3.8 rank f12 item 2.9 min. lm unit luminous flux ranks initial electrical/optical characteristics(at 70ma)
fig.4 relative intensity vs. temperature 3.0 2.5 2.0 1.5 0.5 1.0 0.0 1.0 relative intensity@20ma wavelength (nm) 550 0.0 0.5 600 650 700 fig.3 forward voltage vs. temperature 0 fig.5 relative intensity vs. wavelength ambient temperature( j ) forward voltage@20ma normalize @25 j -40 0.8 -20 1.0 0.9 1.1 1.2 relative intensity@20ma normalize @25 j 80 40 20 60 100 ambient temperature( j ) -20 -40 20 060 40 80 100 3.0 2.0 1.0 1.5 2.5 fig.2 relative intensity vs. forward current typical electro-optical characteristics curve 0.5 0.0 ligitek electronics co.,ltd. property of ligitek only fig.1 forward current vs. forward voltage forward voltage(v) forward current(ma) 1.0 0 1 1.5 10 1 100 ur(h) chip 1000 relative intensity normalize @20ma 2.0 2.5 3.0 4/6 page forward current(ma) 1 10 100 1000 3.5 part no. LUR9653H-30B-WJ
ligitek electronics co.,ltd. property of ligitek only page 5/6 part no. LUR9653H-30B-WJ time(sec) 60 seconds max 0x preheat 0 50 25x 120x 2 /sec max 100 260x temp(c) 260c3sec max 5/sec max 150 soldering condition(pb-free) 1.iron: soldering iron:30w max temperature 350c max soldering time:3 seconds max(one time) distance:2mm min(from solder joint to body) dip soldering preheat: 120 c max preheat time: 60seconds max ramp-up 2c/sec(max) ramp-down:-5c/sec(max) solder bath:260 c max dipping time:3 seconds max distance:2mm min(from solder joint to body) 2.wave soldering profile
reference standard description page 6/6 mil-std-750: 1026 mil-std-883: 1005 jis c 7021: b-1 jis c 7021: b-12 mil-std-883:1008 jis c 7021: b-10 mil-std-202:103b jis c 7021: b-11 mil-std-202: 107d mil-std-750: 1051 mil-std-883: 1011 test condition test item reliability test: 1.ta=-40 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) 1.ta=105 j? 5 j 2.t=1000 hrs (-24hrs, + 72hrs) operating life test low temperature storage test high temperature storage test 1.ta=65 j? 5 j 2.rh=90 %~95% 3.t=240hrs ? 2hrs 1.ta=105 j? 5 j &-40 j? 5 j (10min) (10min) 2.total 10 cycles high temperature high humidity test thermal shock test 1.under room temperature 2.if=20ma 3.t=1000 hrs (-24hrs, + 72hrs) the purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. the purpose of this is the resistance of the device which is laid under condition of high temperature for hours. the purpose of this is the resistance of the device which is laid under condition of low temperature for hours. the purpose of this test is the resistance of the device under tropical for hours. this test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. ligitek electronics co.,ltd. property of ligitek only mil-std-202: 208d mil-std-750: 2026 mil-std-883: 2003 jis c 7021: a-2 1.t.sol=230 j? 5 j 2.dwell time=5 ? 1sec solderability test this test intended to see soldering well performed or not. solder resistance test this test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. 1.t.sol=260 j? 5 j 2.dwell time= 10 ? 1sec. mil-std-202: 210a mil-std-750: 2031 jis c 7021: a-1 part no. LUR9653H-30B-WJ
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