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| HN1L03FU TOSHIBA Field Effect Transistor Silicon N*P Channel MOS Type HN1L03FU High Speed Switching Applications Analog Switch Applications Unit in mm Q1, Q2 common l Low threshold voltage Q1: Vth = 0.8~2.5V l High speed l Small package Q2: Vth =-0.5~-1.5V Q1 Maximum Ratings (Ta = 25C) Characteristic Drain-Source voltage Gate-Source voltage Drain current Symbol VDS VGSS ID Rating 50 10 50 Unit V V mA Q2 Maximum Ratings (Ta = 25C) Characteristic Drain-Source voltage Gate-Source voltage Drain current Symbol VDS VGSS ID Rating -20 -7 -50 Unit V V mA JEDEC EIAJ TOSHIBA Weight: 6.8mg 2-2J1C Marking Maximum Ratings (Q1, Q2 Common) (Ta = 25C) Characteristic Drain power dissipation Channel temperature Storage temperature range Symbol PD* Tch Tstg Rating 200 150 -55~150 Unit mW C C Equivalent Circuit (Top View) * Total rating 000707EAA2 * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. 2001-01-23 1/6 HN1L03FU Q1 Electrical Characteristics (Ta = 25C) Characteristic Gate leakage current Drain-Source breakdown voltage Drain cut-off current Gate threshold voltage Forward transfer admittance Drain-Source ON resistance Input capacitance Reverse transfer capacitance Output capacitance Turn-on time Switching time Turn-off time toff Symbol IGSS Test Condition VGS = 10V, VDS = 0 Min 50 0.8 20 Typ. 20 6.3 1.3 5.7 0.11 0.15 Max 1 1 2.5 50 Unit A V A V mS pF pF pF s s V (BR) DSS ID = 100A, VGS = 0 IDSS Vth |Yfs| RDS (ON) Ciss Crss Coss ton VDS = 50V, VGS = 0 VDS = 5V, ID = 0.1mA VDS = 5V, ID = 10mA ID = 10mA, VGS = 4.0V VDS = 5V, VGS = 0, f = 1MHz VDS = 5V, VGS = 0, f = 1MHz VDS = 5V, VGS = 0, f = 1MHz VDD = 5V, ID = 10mA, VGS = 0~4.0V VDD = 5V, ID = 10mA, VGS = 0~4.0V Q2 Electrical Characteristics (Ta = 25C) Characteristic Gate leakage current Drain-Source breakdown voltage Drain cut-off current Gate threshold voltage Forward transfer admittance Drain-Source ON resistance Input capacitance Reverse transfer capacitance Output capacitance Turn-on time Switching time Turn-off time toff Symbol IGSS Test Condition VGS = -7V, VDS = 0 Min -20 -0.5 15 Typ. 20 10.4 2.8 8.4 0.15 0.13 Max -1 -1 -1.5 40 Unit A V A V mS pF pF pF s s V (BR) DSS ID = -100A, VGS = 0 IDSS Vth |Yfs| RDS (ON) Ciss Crss Coss ton VDS = -20V, VGS = 0 VDS = -3V, ID = -0.1mA VDS = -3V, ID = -10mA ID = -10mA, VGS = -2.5V VDS = -3V, VGS = 0, f = 1MHz VDS = -3V, VGS = 0, f = 1MHz VDS = -3V, VGS = 0, f = 1MHz VDD = -3V, ID = -10mA, VGS = 0~-2.5V VDD = -3V, ID = -10mA, VGS = 0~-2.5V 000707EAA2 * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. * The information contained herein is subject to change without notice. 2001-01-23 2/6 HN1L03FU Q1 (Nch MOS FET) Switching Time Test Circuit 2001-01-23 3/6 HN1L03FU Q1 (Nch MOS FET) 2001-01-23 4/6 HN1L03FU Q2 (Pch MOS FET) Switching Time Test Circuit 2001-01-23 5/6 HN1L03FU Q2 (Pch MOS FET) (Q1, Q2 common) 2001-01-23 6/6 |
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