 |
|
| If you can't view the Datasheet, Please click here to try to view without PDF Reader . |
|
|
|
| If you can't view the Datasheet, Please click here to try to view without PDF Reader . |
|
|
| Datasheet File OCR Text: |
| DICE/DWF SPECIFICATION RH1185MK Negative Regulator with Adjustable Current Limit PAD FUNCTION 1. 2. 3. 4. 5. REF VIN VOUT GND FB DIE CROSS REFERENCE LTC Finished Part Number RH1185MK RH1185MK Order Part Number RH1185MK DICE RH1185MK DWF* 2 3 2 4 4 5 110mils x 116mils Backside metal: Alloyed Gold Layer Backside Potential: VIN Pads 2 Please refer to LTC standard product data sheet for other applicable product information. *DWF = DICE in wafer form. 1 L, LT, LTC and LTM are registered trademarks of Linear Technology Corporation. All other trademarks are the property of their respective owners. unless otherwise noted. PARAMETER DICE/DWF ELECTRICAL TEST LIMITS VIN = 7.4V, VOUT = 5V, IOUT = 1mA, RLIM = 4.02k, CONDITIONS VIN - VOUT = 5V, VOUT = VREF VOUT = VREF IOUT = 0.5A, VOUT = 5V IOUT = 3A, VOUT = 5V VIN - VOUT = 1V to 20V, VOUT = 5V IOUT = 1A, VOUT = VREF VIN - VOUT = 1.5V VIN - VOUT = 20V VIN - VOUT = 30V RLIM = 5k, VOUT = 1V RLIM = 15k, VOUT = 1V IOUT = 5mA, VOUT = VREF , 4V VIN 25V 11 3.3 1 0.2 2.7 0.9 MIN -1.1 MAX 1.1 2 0.4 1.05 0.01 4.5 4.2 2.6 1 3.3 1.1 3.5 19 UNITS % A V V %/V V A A A A A mA A Reference Voltage Tolerance (at FB Pin, Note 2) Feedback Pin Bias Current Dropout Voltage (Note 3) Line Regulation (Note 6) Minimum Input Voltage (Note 4) Internal Current Limit (Note 8) External Current Limit (Note 7) Quiescent Supply Current (Note 5) REF Pin Shutoff Current Note 1: Dice are probe tested at 25C to the limits shown except for high current tests. Dice are tested under low current conditions which assure full load current specifications when assembled in packaging systems approved by Linear Technology. For absolute maximum ratings, typical specifications, performance curves and finished product specifications, please refer to the standard product RH data sheet. Note 2: Testing is done using a pulsed low duty cycle technique. See thermal regulation specifications in the LT1185 data sheet for output changes due to heating effects. Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the interconnection of its circuits as described herein will not infringe on existing patent rights. 1 DICE/DWF SPECIFICATION RH1185MK unless otherwise noted. DICE/DWF ELECTRICAL TEST LIMITS VIN = 7.4V, VOUT = 5V, IOUT = 1mA, RLIM = 4.02k, Note 5: Supply current is measured on the ground pin, and does not include load current, RLIM, or output divider current. Note 6: Line regulation is measured on a pulse basis with a pulse width of 2ms to minimize heating. DC regulation will be affected by thermal regulation and temperature coefficient of the reference. See the Applications Information section of the LT1185 data sheet for details. Note 7: External current limit is programmed with a resistor from REF pin to GND pin. The value is 15K * A/ILIMIT . Note 8: For VIN - VOUT = 1.5V, VIN = 5V and VOUT = 3.5V. For all other current limit tests VOUT = 1V. Note 3: Dropout voltage is tested by reducing input voltage until the output drops 1% below its nominal value. Tests are done at 0.5A and 3A. The power transistor looks basically like a pure resistance in this range so that minimum differential at any intermediate current can be calculated by interpolation; VDROPOUT = 0.25V + 0.25 * IOUT. For load current other than 0.5A and 3.0A, see the graph in the LT1185 data sheet. Note 4: Minimum input voltage is limited by base emitter voltage drive of the power transistor section, not saturation as measured in Note 3. For output voltages below 4V, minimum input voltage specification may limit dropout voltage before transistor saturation limit. Wafer level testing is performed per the indicated specifications for dice. Considerable differences in performance can often be observed for dice versus packaged units due to the influences of packaging and assembly on certain devices and/or parameters. Please consult factory for more information on dice performance and lot qualifications via lot sampling test procedures. Dice data sheet subject to change. Please consult factory for current revision in production. I.D.No. 66-13-1185MK 2 Linear Technology Corporation 1630 McCarthy Blvd., Milpitas, CA 95035-7417 (408) 432-1900 FAX: (408) 434-0507 LT 0309 * PRINTED IN USA www.linear.com (c) LINEAR TECHNOLOGY CORPORATION 2009 |
Price & Availability of RH1185MK
 |
|
|
|
|
All Rights Reserved © IC-ON-LINE 2003 - 2022 |
| [Add Bookmark] [Contact Us] [Link exchange] [Privacy policy] |
|
Mirror Sites : [www.datasheet.hk]
[www.maxim4u.com] [www.ic-on-line.cn]
[www.ic-on-line.com] [www.ic-on-line.net]
[www.alldatasheet.com.cn]
[www.gdcy.com]
[www.gdcy.net] |