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  Datasheet File OCR Text:
 Bulletin I0140J 09/00
IR207DM16CCB
STANDARD RECOVERY DIODES
Junction Size: Wafer Size: VRRM Class: Passivation Process: Reference IR Packaged Part:
Rectangular 207 x 157 mils 4" 1600 V Glassivated MOAT 20ETS Series
Major Ratings and Characteristics
Parameters
VFM VRRM Maximum Forward Voltage Reverse Breakdown Voltage
Units
1.15 V 1600 V (**)
Test Conditions
T J = 25C, I F = 20 A TJ = 25C, I RRM = 100 A
(*)
(*) Nitrogen flow on die edge. (**) Wafer and die Probe test clamped at 1200V to limit arcing. 1600V BV testable only in encapsulated packages
Mechanical Characteristics
Nominal Back Metal Composition, Thickness Nominal Front Metal Composition, Thickness Chip Dimensions Wafer Diameter Wafer Thickness Maximum Width of Sawing Line Reject Ink Dot Size Ink Dot Location Recommended Storage Environment Cr - Ni - Ag (1 KA - 4 KA - 6 KA) 100% Al, (20 m) 207 x 157 mils (see drawing) 100 mm, with std. < 110 > flat 330 m, 10 m 45 m 0.25 mm diameter minimum See drawing Storage in original container, in dessicated nitrogen, with no contamination
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1
IR207DM16CCB
Bulletin I0140J 09/00
Ordering Information Table
Device Code
IR
1 1 2 3 4 5 6 7 International Rectifier Device Chip Dimension in Mils
207
2
D
3
M
4
16
5
C
6
CB
7
Type of Device: D = Wire Bondable Standard Recovery Diode Passivation Process: M = Glassivated MOAT Voltage code: Code x 100 = VRRM Metallization: C = Aluminium (Anode) - Silver (Cathode) CB = Probed Uncut Die (wafer in box)
None = Probed Die in chip carrier
Outline Table
All dimensions are in microns (mils)
2
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IR207DM16CCB
Bulletin I0140J 09/00
Wafer Layout
TOP VIEW N 304 Basic Cells
All dimensions are in millimeters
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