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SMPS MOSFET PD - 94805 IRFIB7N50APBF HEXFET(R) Power MOSFET Applications Switch Mode Power Supply ( SMPS ) Uninterruptable Power Supply High speed power switching High Voltage Isolation = 2.5KVRMS Lead-Free Benefits Low Gate Charge Qg results in Simple Drive Requirement Improved Gate, Avalanche and dynamic dv/dt Ruggedness Fully Characterized Capacitance and Avalanche Voltage and Current Effective Coss specified ( See AN 1001) Absolute Maximum Ratings Parameter ID @ TC = 25C ID @ TC = 100C IDM PD @TC = 25C VGS dv/dt TJ TSTG Continuous Drain Current, VGS @ 10V Continuous Drain Current, VGS @ 10V Pulsed Drain Current Power Dissipation Linear Derating Factor Gate-to-Source Voltage Peak Diode Recovery dv/dt Operating Junction and Storage Temperature Range Soldering Temperature, for 10 seconds Mounting torqe, 6-32 or M3 screw VDSS 500V Rds(on) max 0.52 ID 6.6A TO-220 FULLP AK GDS Max. 6.6 4.2 44 60 0.48 30 6.9 -55 to + 150 300 (1.6mm from case ) 10 lbf*in (1.1N*m) Units A W W/C V V/ns C Applicable Off Line SMPS Topologies: Two Transistor Forward Half & Full Bridge Convertors Power Factor Correction Boost Notes through are on page 8 www.irf.com 1 10/31/03 IRFIB7N50APBF Static @ TJ = 25C (unless otherwise specified) V(BR)DSS V(BR)DSS/TJ RDS(on) VGS(th) IDSS IGSS Parameter Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Drain-to-Source Leakage Current Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage Min. Typ. Max. Units Conditions 500 --- --- V VGS = 0V, ID = 250A --- 0.61 --- V/C Reference to 25C, ID = 1mA --- --- 0.52 VGS = 10V, ID = 4.0A 2.0 --- 4.0 V VDS = VGS, ID = 250A --- --- 25 VDS = 500V, VGS = 0V A --- --- 250 VDS = 400V, VGS = 0V, TJ = 125C --- --- 100 VGS = 30V nA --- --- -100 VGS = -30V Dynamic @ TJ = 25C (unless otherwise specified) gfs Qg Qgs Qgd td(on) tr td(off) tf Ciss Coss Crss Coss Coss Coss eff. Parameter Forward Transconductance Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Input Capacitance Output Capacitance Reverse Transfer Capacitance Output Capacitance Output Capacitance Effective Output Capacitance Min. 6.1 --- --- --- --- --- --- --- --- --- --- --- --- --- Typ. --- --- --- --- 14 35 32 28 1423 208 8.1 2000 55 97 Max. Units Conditions --- S VDS = 50V, ID = 6.6A 52 ID = 11A 13 nC VDS = 400V 18 VGS = 10V, See Fig. 6 and 13 --- VDD = 250V --- ID = 11A ns --- R G = 9.1 --- R D = 22,See Fig. 10 --- VGS = 0V --- VDS = 25V --- pF = 1.0MHz, See Fig. 5 --- VGS = 0V, VDS = 1.0V, = 1.0MHz --- VGS = 0V, VDS = 400V, = 1.0MHz --- VGS = 0V, VDS = 0V to 400V Avalanche Characteristics Parameter EAS IAR EAR Single Pulse Avalanche Energy Avalanche Current Repetitive Avalanche Energy Typ. --- --- --- Max. 275 11 6.0 Units mJ A mJ Thermal Resistance Parameter RJC RJA Junction-to-Case Junction-to-Ambient Parameter Continuous Source Current (Body Diode) Pulsed Source Current (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse RecoveryCharge Forward Turn-On Time Typ. --- --- Min. Typ. Max. Units Max. 2.1 65 Units C/W Diode Characteristics IS ISM VSD trr Qrr ton Conditions D MOSFET symbol --- --- 6.6 showing the A G integral reverse 44 --- --- S p-n junction diode. --- --- 1.5 V TJ = 25C, IS = 11A, VGS = 0V --- 510 770 ns TJ = 25C, IF = 11A --- 3.4 5.1 C di/dt = 100A/s Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) 2 www.irf.com IRFIB7N50APBF 100 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP 100 I D , Drain-to-Source Current (A) 10 I D , Drain-to-Source Current (A) 4.5V 20s PULSE WIDTH TJ = 25 C 1 10 100 VGS 15V 10V 8.0V 7.0V 6.0V 5.5V 5.0V BOTTOM 4.5V TOP 10 1 0.1 0.1 1 4.5V 1 10 20s PULSE WIDTH TJ = 150 C 100 VDS , Drain-to-Source Voltage (V) VDS , Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics Fig 2. Typical Output Characteristics 100 3.0 RDS(on) , Drain-to-Source On Resistance (Normalized) ID = 11A I D , Drain-to-Source Current (A) 2.5 10 2.0 TJ = 150 C 1.5 1 TJ = 25 C 1.0 0.5 0.1 4.0 V DS = 100V 20s PULSE WIDTH 5.0 6.0 7.0 8.0 9.0 0.0 -60 -40 -20 VGS = 10V 0 20 40 60 80 100 120 140 160 VGS , Gate-to-Source Voltage (V) TJ , Junction Temperature ( C) Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance Vs. Temperature www.irf.com 3 IRFIB7N50APBF 2400 2000 VGS , Gate-to-Source Voltage (V) C, Capacitance (pF) Ciss 1600 V GS = 0V, f = 1MHz C iss = Cgs + C gd , Cds SHORTED C rss = C gd C oss = C ds + C gd 20 ID = 11A 6.6A VDS = 400V VDS = 250V VDS = 100V 16 Coss 1200 12 8 800 Crss 400 4 0 1 10 100 1000 A 0 FOR TEST CIRCUIT SEE FIGURE 13 0 10 20 30 40 50 VDS , Drain-to-Source Voltage (V) QG , Total Gate Charge (nC) Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage 100 1000 ISD , Reverse Drain Current (A) OPERATION IN THIS AREA LIMITED BY RDS(on) 10 I D , Drain Current (A) 100 10us 10 100us 1ms 1 10ms TJ = 150 C 1 TJ = 25 C 0.1 0.0 V GS = 0 V 0.4 0.8 1.2 1.6 0.1 TC = 25 C TJ = 150 C Single Pulse 10 100 1000 10000 VSD ,Source-to-Drain Voltage (V) VDS , Drain-to-Source Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage Fig 8. Maximum Safe Operating Area 4 www.irf.com IRFIB7N50APBF 7.0 6.0 VDS VGS RG RD D.U.T. + ID , Drain Current (A) 5.0 4.0 3.0 2.0 1.0 0.0 -VDD 10V Pulse Width 1 s Duty Factor 0.1 % Fig 10a. Switching Time Test Circuit VDS 90% 25 50 75 100 125 150 TC , Case Temperature ( C) Fig 9. Maximum Drain Current Vs. Case Temperature 10% VGS td(on) tr t d(off) tf Fig 10b. Switching Time Waveforms 10 Thermal Response (Z thJC ) 1 D = 0.50 0.20 0.10 0.1 0.05 0.02 0.01 SINGLE PULSE (THERMAL RESPONSE) P DM t1 t2 Notes: 1. Duty factor D = t 1 / t 2 2. Peak T J = P DM x Z thJC + TC 0.001 0.01 0.1 1 10 0.01 0.00001 0.0001 t1 , Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRFIB7N50APBF EAS , Single Pulse Avalanche Energy (mJ) 15V 600 TOP 500 VDS L DRIVER BOTTOM ID 4.9A 7.0A 11A 400 RG 20V D.U.T IAS tp + V - DD A 300 0.01 Fig 12a. Unclamped Inductive Test Circuit V(BR)DSS tp 200 100 0 25 50 75 100 125 150 Starting TJ , Junction Temperature ( C) I AS Fig 12b. Unclamped Inductive Waveforms QG Fig 12c. Maximum Avalanche Energy Vs. Drain Current 10 V QGS QGD V DSav , Avalanche Voltage (V) 660 VG 640 Charge Fig 13a. Basic Gate Charge Waveform Current Regulator Same Type as D.U.T. 620 50K 12V .2F .3F 600 D.U.T. VGS 3mA + V - DS 580 0.0 1.0 2.0 3.0 4.0 5.0 6.0 7.0 A I av , Avalanche Current (A) IG ID Current Sampling Resistors Fig 13b. Gate Charge Test Circuit Fig 12d. Typical Drain-to-Source Voltage Vs. Avalanche Current 6 www.irf.com IRFIB7N50APBF Peak Diode Recovery dv/dt Test Circuit D.U.T + Circuit Layout Considerations * Low Stray Inductance * Ground Plane * Low Leakage Inductance Current Transformer + + - RG * * * * dv/dt controlled by RG Driver same type as D.U.T. ISD controlled by Duty Factor "D" D.U.T. - Device Under Test + VDD Driver Gate Drive P.W. Period D= P.W. Period VGS=10V * D.U.T. ISD Waveform Reverse Recovery Current Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt VDD Re-Applied Voltage Inductor Curent Body Diode Forward Drop Ripple 5% ISD * VGS = 5V for Logic Level Devices Fig 14. For N-Channel HEXFETS www.irf.com 7 IRFIB7N50APBF TO-220 Full-Pak Package Outline Dimensions are shown in millimeters (inches) TO-220 Full-Pak Part Marking Information EXAM PLE: TH IS IS AN IRFI84 0G W ITH A SSEM B LY LO T C O DE 3 43 2 ASSEM BLED O N W W 24 1999 IN TH E ASSEM BLY LIN E "K" PART N U M BER IN TERN ATIO N AL RECTIFIER LO G O ASSEM BLY LO T C O D E IRFI840G 924K 34 32 Note: "P" in assembly line position indicates "Lead-Free" D ATE CO D E YEAR 9 = 1999 WEEK 24 LIN E K Notes: Repetitive rating; pulse width limited by max. junction temperature. ( See fig. 11 ) Starting TJ = 25C, L = 4.5mH RG = 25, IAS = 11A. (See Figure 12) ISD 11A, di/dt 140A/s, VDD V(BR)DSS, TJ 150C Pulse width 300s; duty cycle 2%. Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS Uses IRFB11N50A data and test conditions t=60s,f=60Hz Data and specifications subject to change without notice. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information.10/03 8 www.irf.com |
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