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TPC6602 TOSHIBA Transistor Silicon PNP Epitaxial Type TPC6602 High-Speed Switching Applications DC-DC Converter Applications Strobe Applications * * * High DC current gain: hFE = 200 to 500 (IC = -0.2 A) Low collector-emitter saturation voltage: VCE (sat) = -0.19 V (max) High-speed switching: tf = 25 ns (typ.) Unit: mm Maximum Ratings (Ta = 25C) Characteristics Collector-base voltage Collector-emitter voltage Emitter-base voltage Collector current Base current Collector power dissipation Junction temperature Storage temperature range t = 10 s DC DC Pulse Symbol VCBO VCEO VEBO IC ICP IB PC (Note) Tj Tstg Rating -20 -10 -7 -2.0 -3.5 -200 1.6 0.8 150 -55~150 Unit V V V A mA W C C JEDEC JEITA TOSHIBA 2-3T1 Weight: 0.011 g (typ.) Note: Mounted on FR4 board (glass epoxy, 1.6 mm thick, Cu area: 645 2 mm ) Electrical Characteristics (Ta = 25C) Characteristics Collector cut-off current Emitter cut-off current Collector-emitter breakdown voltage DC current gain Collector-emitter saturation voltage Base-emitter saturation voltage Collector output capacitance Rise time Switching time Storage time Fall time Symbol ICBO IEBO V (BR) CEO hFE (1) hFE (2) VCE (sat) VBE (sat) Cob tr tstg tf Test Condition VCB = -20 V, IE = 0 VEB = -7 V, IC = 0 IC = -10 mA, IB = 0 VCE = -2 V, IC = -0.2 A VCE = -2 V, IC = -0.6 A IC = -0.6 A, IB = -0.02 A IC = -0.6 A, IB = -0.02 A VCB = -10 V, IE = 0, f = 1 MHz See Figure 1 circuit diagram. VCC ~ -6 V, RL = 10 W IB1 = -IB2 = -20 mA Min 3/4 3/4 -10 200 125 3/4 3/4 3/4 3/4 3/4 3/4 Typ. 3/4 3/4 3/4 3/4 3/4 3/4 3/4 12 50 115 25 Max -100 -100 3/4 500 3/4 -0.19 -1.10 3/4 3/4 3/4 3/4 ns V V pF Unit nA nA V 1 2002-03-18 TPC6602 Circuit Configuration VCC RL 6 5 4 Marking 20 ms IB2 IB1 Input IB1 Output H3B IB2 Duty cycle < 1% 1 2 3 Figure 1 Switching Time Test Circuit & Timing Chart 2 2002-03-18 TPC6602 IC - VCE -2 -80 -1.6 -60 -40 -20 10000 Common emitter VCE = -2 V Single pulse test Ta = 100C hFE - IC (A) hFE DC current gain 1000 IC Collector current -1.2 -10 -6 -0.8 100 25 -4 IB = -2 mA -55 -0.4 Common emitter Ta = 25C Single pulse test -0.2 -0.4 -0.6 -0.8 -1 -1.2 10 -0.001 -0.01 -0.1 -1 -10 0 0 Collector current IC (A) Collector-emitter voltage VCE (V) VCE (sat) - IC -1 VBE (sat) - IC -10 Collector-emitter saturation voltage VCE (sat) (V) -0.1 Ta = 100C 25 -0.01 -55 Base-emitter saturation voltage VBE (sat) (V) Common emitter IC/IB = 30 Single pulse test Common emitter IC/IB = 30 Single pulse test -55 -1 25 Ta = 100C -0.001 -0.001 -0.01 -0.1 -1 -10 -0.1 -0.001 -0.01 -0.1 -1 -10 Collector current IC (A) Collector current IC (A) IC - VBE -2 Common emitter VCE = -2 V Single pulse test IC Collector current (A) -1.6 -1.2 -0.8 25 -0.4 Ta = 100C -55 0 0 -0.4 -0.8 -1.2 -1.6 Base-emitter voltage VBE (V) 3 2002-03-18 TPC6602 rth - tw 1000 Transient thermal resistance rth (j-a) (C/W) 100 10 Curves should be applied in thermal limited area. Single pulse Ta = 25C Mounted on FR4 board (glass epoxy, 1.6 mm thick, 2 Cu area: 645 mm ) 1 0.001 0.01 0.1 1 10 100 1000 Pulse width tw (s) Safe Operating Area -10 IC max (Pulse) * IC max (continuous) 10 ms* 1 ms* (A) IC -1 100 ms* 10 s* DC operation (Ta = 25C) Collector current -0.1 -0.01 -0.1 -1 -10 VCEO max *: Single pulse Ta = 25C Note that the curves for 100 ms*, 10 s* and DC operation* will be different when the devices aren't mounted on an FR4 board (glass epoxy, 1.6 mm thick, Cu area: 645 mm2). These characteristic curves must be derated linearly with increase in temperature. -100 Collector-emitter voltage VCE (V) 4 2002-03-18 TPC6602 RESTRICTIONS ON PRODUCT USE 000707EAA * TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability Handbook" etc.. * The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this document shall be made at the customer's own risk. * The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any intellectual property or other rights of TOSHIBA CORPORATION or others. * The information contained herein is subject to change without notice. 5 2002-03-18 |
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