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 TSOP17..XX
Photo Modules for PCM Remote Control Systems
Holder and lead variations Available types for different carrier frequencies
Type TSOP1730XX TSOP1736XX TSOP1738XX TSOP1756XX f0 30 kHz 36 kHz 38 kHz 56 kHz Type TSOP1733XX TSOP1737XX TSOP1740XX f0 33 kHz 36.7 kHz 40 kHz
Description
The TSOP17..XX - series are miniaturized receivers for infrared remote control systems. PIN diode and preamplifier are assembled on lead frame, the epoxy package is designed as IR filter. The demodulated output signal can directly be decoded by a microprocessor. TSOP17.... is the standard IR remote control receiver series, supporting all major transmission codes.
Features
D Photo detector and preamplifier in one package D Internal filter for PCM frequency D Improved shielding against electrical field disturbance
D TTL and CMOS compatibility
D D D D D
Output active low Low power consumption High immunity against ambient light Continuous data transmission possible (1200 bit/s) Suitable burst length 10 cycles/burst
Block Diagram
2 Input Control Circuit VS
100 kW 3 OUT
PIN AGC Band Pass Demodulator 1
GND
94 8136
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
1 (20)
TSOP17..XX
Absolute Maximum Ratings
Tamb = 25_C Parameter Supply Voltage Supply Current Output Voltage Output Current Junction Temperature Storage Temperature Range Operating Temperature Range Power Consumption Soldering Temperature (Pin 2) (Pin 2) (Pin 3) (Pin 3) Test Conditions Symbol VS IS VO IO Tj Tstg Tamb Ptot Tsd Value -0.3...6.0 5 -0.3...6.0 5 100 -25...+85 -25...+85 50 260 Unit V mA V mA C C C mW C
(Tamb 85 C) t 5s
x
x
Basic Characteristics
Tamb = 25_C Parameter Supply Current (Pin 2) pp y Transmission Distance Output Voltage Low (Pin 3) Irradiance (30 - 40 kHz) Test Conditions VS = 5 V, Ev = 0 VS = 5 V, Ev = 40 klx, sunlight Ev = 0, test signal see fig.7, IR diode TSIP5201, IF = 400 mA IOSL = 0.5 mA,Ee = 0.7 mW/m2, f = fo, tp/T = 0.4 Pulse width tolerance: tpi - 5/fo < tpo < tpi + 6/fo, test signal (see fig.7) Pulse width tolerance: tpi - 5/fo < tpo < tpi + 6/fo, test signal (see fig.7) Angle of half transmission distance Symbol ISD ISH d VOSL Ee min 0.35 Min 0.4 Typ 0.6 1.0 35 Max 0.8 Unit mA mA m mV mW/m2
250 0.5
Irradiance (56 kHz)
Ee min
0.4
0.6
mW/m2
Irradiance Directivity
Ee max 1/2
30 45
W/m2 deg
Application Circuit
330 W *) 2 TSOP17.. TSAL62.. 3 4.7 mF *) >10 kW optional +5 V **)
mC
1
96 12108
GND *) only necessary to suppress power supply disturbances **) tolerated supply voltage range : 4.5 V2 (20)
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
TSOP17..XX
Typical Characteristics (Tamb = 25_C unless otherwise specified)
Ee min - Threshold Irradiance ( mW/m2 ) 1.0 E e min / E e - Rel. Responsitivity ( % ) 0.8 2.0 f ( E ) = f0 1.6 1.2 0.8 0.4 0.0 0.7
94 8143
0.6
0.4 0.2 0.0 0.8 0.9 1.0 1.1 1.2 1.3 f / f0 - Relative Frequency
Df ( 3 dB ) = f0 / 10
f = f0
"5%
0.0
94 8147
0.4
0.8
1.2
1.6
2.0
E - Field Strength of Disturbance ( kV / m )
Figure 1. Frequency Dependence of Responsivity
1.0 0.9 tpo - Output Pulse Length (ms) 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 0.1
96 12110
Figure 4. Sensitivity vs. Electric Field Disturbances
10 f = f0 1 kHz
Input burst duration
Ee min - Threshold Irradiance ( mW/m2 )
10 kHz 1
l = 950 nm, optical test signal, fig.7
100 Hz
1.0
10.0
100.0 1000.0 10000.0
94 9106
0.1 0.01
0.1
1
10
100
1000
Ee - Irradiance ( mW/m2 )
DVs RMS - AC Voltage on DC Supply Voltage ( mV )
Figure 2. Sensitivity in Dark Ambient
5.0 4.5 4.0 3.5 3.0 2.5 2.0 1.5 1.0 0.5 0 0.01 0.10 1.00 10.00 100.00 Ambient, l = 950 nm Correlation with ambient light sources ( Disturbance effect ) : 10W/m2 ( Stand.illum.A, T = 2855 K )^8.2 klx ( Daylight, T = 5900 K )
Figure 5. Sensitivity vs. Supply Voltage Disturbances
1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 -30 -15 0 15 30 45 60 75 90 Sensitivity in dark ambient
E e min - Threshold Irradiance (mW/m2 )
^1.4klx
E e min - Threshold Irradiance (mW/m2 )
96 12111
E - DC Irradiance (W/m2)
96 12112
Tamb - Ambient Temperature ( C )
Figure 3. Sensitivity in Bright Ambient
Figure 6. Sensitivity vs. Ambient Temperature
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
3 (20)
TSOP17..XX
Ee Optical Test Signal ( IR diode TSIP 5201, IF = 0.4 A, 30 pulses, f = f0, T = 10 ms T on ,T - Output Pulse Length (ms) off 1.0 0.9 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1 0 0.1 t tpo2 )
96 12114
Ton
t tpi * * tpi Output Signal
1) 2)
w 10/fo is recommended for optimal function
96 12109
T
Toff
l = 950 nm, optical test signal, fig.8
VO VOH VOL
7/f0 < td < 15/f0 tpo = tpi 6/f0
"
1.0
10.0
100.0 1000.0 10000.0
td1 )
Ee - Irradiance (mW/m2)
Figure 7. Output Function
Ee Optical Test Signal 1.0 0.9 I s - Supply Current ( mA ) 0.8 0.7 0.6 0.5 0.4 0.3 0.2 0.1
Figure 10. Output Pulse Diagram
Vs = 5 V
600 ms T = 60 ms
600 ms
t
94 8134
VO VOH VOL
Output Signal, ( see Fig.10 )
0 -30 -15 Ton Toff t
96 12115
0
15
30
45
60
75
90
Tamb - Ambient Temperature ( C )
Figure 8. Output Function
3.0 E e min - Threshold Irradiance (mW/m2 ) 2.5 2.0 1.5 1.0 0.5 0 0
96 12113
Figure 11. Supply Current vs. Ambient Temperature
1.2 1.0 0.8 0.6 0.4 0.2 0 750
94 8408
N=16 pulses per burst
N=32
S ( l ) rel - Relative Spectral Sensitivity
0.1
0.2
0.3
0.4
0.5
0.6
0.7
850
950
1050
1150
tp/T - Duty Cycle
l - Wavelength ( nm )
Figure 9. Sensitivity vs. Duty Cycle
Figure 12. Relative Spectral Sensitivity vs. Wavelength
4 (20)
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
TSOP17..XX
0 10 20 30 0 10 20 30
40 1.0 0.9 0.8 0.7 50 60 70 80 0.6
95 11339p2
40 1.0 0.9 0.8 0.7 50 60 70 80 0.6
95 11340p2
0.6 0.4 0.2 0 0.2 0.4 drel - Relative Transmission Distance
0.6 0.4 0.2 0 0.2 0.4 drel - Relative Transmission Distance
Figure 13. Vertical Directivity y
Figure 14. Horizontal Directivity x
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
5 (20)
TSOP17..XX
Dimensions of TSOP17..CB1 in mm
12826
6 (20)
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
TSOP17..XX
Dimensions of TSOP17..GL1 in mm
12840
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
7 (20)
TSOP17..XX
Dimensions of TSOP17..KA1 in mm
12783
8 (20)
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
TSOP17..XX
Dimensions of TSOP17..KD1 in mm
12823
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
9 (20)
TSOP17..XX
Dimensions of TSOP17..RF1 in mm
12760
10 (20)
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
TSOP17..XX
Dimensions of TSOP17..SA1 in mm
12829
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
11 (20)
TSOP17..XX
Dimensions of TSOP17..SB1 in mm
96 12225
12 (20)
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
TSOP17..XX
Dimensions of TSOP17..SE1 in mm
12830
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
13 (20)
TSOP17..XX
Dimensions of TSOP17..SF1 in mm
12835
14 (20)
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
TSOP17..XX
Dimensions of TSOP17..SK1 in mm
12831
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
15 (20)
TSOP17..XX
Dimensions of TSOP17..TB1 in mm
96 12118
16 (20)
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
TSOP17..XX
Dimensions of TSOP17..UU1 in mm
12827
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
17 (20)
TSOP17..XX
Dimensions of TSOP17..WI1 in mm
12828
18 (20)
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
TSOP17..XX
Dimensions of TSOP17..XG1 in mm
96 12224
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97
19 (20)
TSOP17..XX
Ozone Depleting Substances Policy Statement
It is the policy of TEMIC TELEFUNKEN microelectronic GmbH to 1. Meet all present and future national and international statutory requirements. 2. Regularly and continuously improve the performance of our products, processes, distribution and operating systems with respect to their impact on the health and safety of our employees and the public, as well as their impact on the environment. It is particular concern to control or eliminate releases of those substances into the atmosphere which are known as ozone depleting substances ( ODSs). The Montreal Protocol ( 1987) and its London Amendments ( 1990) intend to severely restrict the use of ODSs and forbid their use within the next ten years. Various national and international initiatives are pressing for an earlier ban on these substances. TEMIC TELEFUNKEN microelectronic GmbH semiconductor division has been able to use its policy of continuous improvements to eliminate the use of ODSs listed in the following documents. 1. Annex A, B and list of transitional substances of the Montreal Protocol and the London Amendments respectively 2 . Class I and II ozone depleting substances in the Clean Air Act Amendments of 1990 by the Environmental Protection Agency ( EPA) in the USA 3. Council Decision 88/540/EEC and 91/690/EEC Annex A, B and C ( transitional substances ) respectively. TEMIC can certify that our semiconductors are not manufactured with ozone depleting substances and do not contain such substances.
We reserve the right to make changes to improve technical design and may do so without further notice. Parameters can vary in different applications. All operating parameters must be validated for each customer application by the customer. Should the buyer use TEMIC products for any unintended or unauthorized application, the buyer shall indemnify TEMIC against all claims, costs, damages, and expenses, arising out of, directly or indirectly, any claim of personal damage, injury or death associated with such unintended or unauthorized use. TEMIC TELEFUNKEN microelectronic GmbH, P.O.B. 3535, D-74025 Heilbronn, Germany Telephone: 49 ( 0 ) 7131 67 2831, Fax number: 49 ( 0 ) 7131 67 2423
20 (20)
TELEFUNKEN Semiconductors Rev. A3, 10-Oct-97


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