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 74ACTQ652 Quiet Series Transceiver/Register
June 1991 Revised September 2000
74ACTQ652 Quiet Series Transceiver/Register
General Description
The ACTQ652 consists of bus transceiver circuits with Dtype flip-flops, and control circuitry arranged for multiplexed transmission of data directly from the input bus or from internal registers. Data on the A or B bus will be clocked into the registers as the appropriate clock pin goes to the HIGH logic level. Output Enable pins (OEAB, OEBA) are provided to control the transceiver function. The ACTQ652 utilizes Fairchild FACT Quiet Series technology to guarantee quiet output switching and improved dynamic threshold performance. FACT Quiet Series features GTO output control and undershoot corrector in addition to split ground bus for superior performance.
Features
s Guaranteed simultaneous switching noise level and dynamic threshold performance s Guaranteed pin-to-pin skew AC performance s Independent registers for A and B buses s Multiplexed real-time and stored data s Outputs source/sink 24 mA s TTL-compatible inputs
Ordering Code:
Order Number 74ACTQ652SC 74ACTQ652MTC 74ACTQ652SPC Package Number M24B MTC24 N24C Package Description 24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide 24-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide 24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Device also available in Tape and Reel. Specify by appending suffix letter "X" to the ordering code.
Logic Symbols
IEEE/IEC
Connection Diagram
Pin Descriptions
Pin Names A0-A7, B0-B7 CPAB, CPBA SAB, SBA OEAB, OEBA Description A and B Inputs/3-STATE Outputs Clock Inputs Select Inputs Output Enable Inputs
FACT, Quiet Series, FACT Quiet Series and GTO are trademarks of Fairchild Semiconductor Corporation.
(c) 2000 Fairchild Semiconductor Corporation
DS010933
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74ACTQ652
Function Table
Inputs OEAB L L X H L L L L H H H OEBA H H H H X L L L H H L CPAB H or L CPBA H or L SAB X X X X X X X X L H H SBA X Input X X X X X L Output X X H or L H or L H or L X X H or L H X Input X H Output Output Stored B Data to A Bus
H = HIGH Voltage Level L = LOW Voltage Level X = Immaterial = LOW-to-HIGH Clock Transition
Inputs/Outputs (Note 1) Operating Mode A0 thru A7 B0 thru B7 Isolation Input Store A and B Data Input Input Not Specified Output Not Specified Output Input Input Input Store B Data to A Bus Real-Time A Data to B Bus Output Stored A Data to B Bus Stored A Data to B Bus and Store A, Hold B Store A in Both Registers Hold A, Store B Store B in Both Registers Real-Time B Data to A Bus
H or L

X
H or L

X
Note 1: The data output functions may be enabled or disabled by various signals at OEAB or OEBA inputs. Data input functions are always enabled, i.e., data at the bus pins will be stored on every LOW-to-HIGH transition on the clock inputs.
Logic Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
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74ACTQ652
Functional Description
In the transceiver mode, data present at the HIGH impedance port may be stored in either the A or B register or both. The select (SAB, SBA) controls can multiplex stored and real-time. The examples in Figure 1 demonstrate the four fundamental bus-management functions that can be performed with the Octal bus transceivers and receivers. Data on the A or B data bus, or both can be stored in the internal D-type flip-flop by LOW-to-HIGH transitions at the appropriate Clock Inputs (CPAB, CPBA) regardless of the Select or Output Enable Inputs. When SAB and SBA are in the real time transfer mode, it is also possible to store data without using the internal D-type flip-flops by simultaneously enabling OEAB and OEBA. In this configuration each Output reinforces its Input. Thus when all other data sources to the two sets of bus lines are in a HIGH impedance state, each set of bus lines will remain at its last state.
Note A: Real-Time Transfer Bus B to Bus A
Note B: Real-Time Transfer Bus A to Bus B
OEAB OEBA CPAB CPBA L L X X
SAB X
SBA L
OEAB OEBA CPAB CPBA H H X X
SAB L
SBA X
Note C: Storage
Note D: Transfer Storage Data to A or B
OEAB OEBA CPAB CPBA X L L H X H X X

SAB X X X
SBA X X X FIGURE 1.
OEAB OEBA CPAB CPBA H L H or L H or L
SAB H
SBA H
3
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74ACTQ652
Absolute Maximum Ratings(Note 2)
Supply Voltage (VCC) DC Input Diode Current (IIK) VI = -0.5V VI = VCC + 0.5V DC Input Voltage (VI) DC Output Diode Current (IOK) VO = -0.5V VO = VCC + 0.5V DC Output Voltage (VO) DC Output Source or Sink Current (IO) DC VCC or Ground Current per Output Pin (ICC or IGND) Storage Temperature (TSTG) DC Latch-Up Source or Sink Current Junction Temperature (TJ) PDIP 140C
-0.5V to +7.0V -20 mA +20 mA -0.5V to VCC + 0.5V -20 mA +20 mA -0.5V to VCC + 0.5V 50 mA 50 mA -65C to +150C 300 mA
Recommended Operating Conditions
Supply Voltage (VCC) Input Voltage (VI) Output Voltage (VO) Operating Temperature (TA) Minimum Input Edge Rate V/t VIN from 0.8V to 2.0V VCC @ 4.5V, 5.5V 125 mV/ns 4.5V to 5.5V 0V to VCC 0V to VCC
-40C to +85C
Note 2: Absolute maximum ratings are those values beyond which damage to the device may occur. The databook specifications should be met, without exception, to ensure that the system design is reliable over its power supply, temperature, and output/input loading variables. Fairchild does not recommend operation of FACT circuits outside databook specifications.
DC Electrical Characteristics
Symbol VIH VIL VOH Parameter Minimum HIGH Level Input Voltage Maximum LOW Level Input Voltage Minimum HIGH Level Output Voltage VCC (V) 4.5 5.5 4.5 5.5 4.5 5.5 4.5 5.5 VOL Maximum LOW Level Output Voltage 4.5 5.5 4.5 5.5 IIN IOZT ICCT IOLD IOHD ICC VOLP VOLV VIHD VILD Maximum Input Leakage Current Maximum I/O Leakage Current Maximum ICC/Input Minimum Dynamic Output Current (Note 4) Maximum Quiescent Supply Current Maximum HIGH Level Output Noise Maximum LOW Level Output Noise Minimum HIGH Level Dynamic Input Voltage Maximum LOW Level Dynamic Input Voltage 5.5 5.5 5.5 5.5 5.5 5.5 5.0 5.0 5.0 5.0 1.1 -0.6 1.9 1.2 8.0 1.5 -1.2 2.2 0.8 0.6 0.001 0.001 TA = +25C Typ 1.5 1.5 1.5 1.5 4.49 5.49 2.0 2.0 0.8 0.8 4.4 5.4 3.86 4.86 0.1 0.1 0.36 0.36 0.1 0.6 TA = -40C to +85C Guaranteed Limits 2.0 2.0 0.8 0.8 4.4 5.4 3.76 4.76 0.1 0.1 0.44 0.44 1.0 6.0 1.5 75 -75 80.0 A A mA mA mA A V V V V V Units V V V Conditions VOUT = 0.1V or VCC - 0.1V VOUT = 0.1V or VCC - 0.1V IOUT = -50 A VIN = VIL or VIH V IOH = -24 mA IOH = -24 mA (Note 3) IOUT = 50 A VIN = VIL or VIH V IOL = 24 mA IOL = 24 mA (Note 3) VI = VCC, GND VI = VIL, VIH VO = VCC, GND VI = VCC - 2.1V VOLD = 1.65V Max VOHD = 3.85V Min VIN = VCC or GND Figures 2, 3 (Note 5)(Note 6) Figures 2, 3 (Note 5)(Note 6) (Note 5)(Note 7) (Note 5)(Note 7)
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74ACTQ652
DC Electrical Characteristics
Note 5: PDIP package.
(Continued)
Note 3: All outputs loaded; thresholds on input associated with output under test. Note 4: Maximum test duration 2.0 ms, one output loaded at a time. Note 6: Max number of outputs defined as (n). Data inputs are driven 0V to 3V. One output @ GND. Note 7: Max number of data inputs (n) switching. (n - 1) inputs switching 0V to 3V (ACTQ). Input-under-test switching: 3V to threshold (VILD), 0V to threshold (VIHD), f = 1 MHz.
AC Electrical Characteristics
VCC Symbol fMAX tPLH tPHL tPLH tPHL tPLH tPHL tPZH tPZL tPHZ tPLZ tPZH tPZL tPHZ tPLZ tS(H) tS(L) tH(H) tH(L) tW(H) tW(L) tOSHL tOSLH Parameter Maximum Clock Frequency Propagation Delay Clock to Bus Propagation Delay Bus to Bus Propagation Delay SBA or SAB to A or B Enable Time OEBA to A (Note 8) Disable Time OEBA to A (Note 8) Enable Time OEAB to B Disable Time OEAB to B Setup Time, HIGH or LOW, Bus to Clock Hold Time, HIGH or LOW, Bus to Clock Clock Pulse Width HIGH or LOW Output to Output Skew (Note 9) A to B, B to A or Clock to Output
Note 8: Voltage Range 5.0 is 5.0V 0.5V. Note 9: Skew is defined as the absolute value of the difference between the actual propagation delay for any separate outputs of the same device. The specification applies to any output switching in the same direction, either HIGH-to-LOW (tOSHL) or LOW-to-HIGH (tOSLH). Parameter guaranteed by design.
TA = +25C CL = 50 pF Min Typ Max
TA = -40C to +85C CL = 50 pF Min Max MHz Units
(V) (Note 8) 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.0 5.0 2.0 2.0 2.5 2.0 1.0 2.0 1.0 3.0 1.5 4.0
7.0 6.5 6.5 7.0 5.0 7.0 5.0
9.5 9.0 10.0 10.5 8.0 10.5 8.0
2.0 2.0 2.5 2.0 1.0 2.0 1.0 3.0 1.5 4.0
10.0 9.5 10.5 11.0 8.5 11.0 8.5
ns ns ns
ns
ns ns ns ns
5.0
0.5
1.0
1.0
ns
Capacitance
Symbol CIN CPD Parameter Input Capacitance Power Dissipation Capacitance Typ 4.5 54 Units pF pF VCC = 5.0V VCC = 5.0V Conditions
5
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74ACTQ652
FACT Noise Characteristics
The setup of a noise characteristics measurement is critical to the accuracy and repeatability of the tests. The following is a brief description of the setup used to measure the noise characteristics of FACT. Equipment: Hewlett Packard Model 8180A Word Generator PC-163A Test Fixture Tektronics Model 7854 Oscilloscope Procedure: 1. Verify Test Fixture Loading: Standard Load 50 pF, 500. 2. Deskew the HFS generator so that no two channels have greater than 150 ps skew between them. This requires that the oscilloscope be deskewed first. It is important to deskew the HFS generator channels before testing. This will ensure that the outputs switch simultaneously. 3. Terminate all inputs and outputs to ensure proper loading of the outputs and that the input levels are at the correct voltage. 4. Set the HFS generator to toggle all but one output at a frequency of 1 MHz. Greater frequencies will increase DUT heating and effect the results of the measurement. 5. Set the HFS generator input levels at 0V LOW and 3V HIGH for ACT devices and 0V LOW and 5V HIGH for AC devices. Verify levels with an oscilloscope. VOLP/VOLV and VOHP/V OHV: * Determine the quiet output pin that demonstrates the greatest noise levels. The worst case pin will usually be the furthest from the ground pin. Monitor the output voltages using a 50 coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. * Measure VOLP and VOLVon the quiet output during the worst case transition for active and enable. Measure VOHP and VOHV on the quiet output during the worst case active and enable transition. * Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements. VILD and VIHD: * Monitor one of the switching outputs using a 50 coaxial cable plugged into a standard SMB type connector on the test fixture. Do not use an active FET probe. * First increase the input LOW voltage level, VIL, until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds VIL limits, or on output HIGH levels that exceed VIH limits. The input LOW voltage level at which oscillation occurs is defined as V ILD. * Next decrease the input HIGH voltage level, VIH until the output begins to oscillate or steps out a min of 2 ns. Oscillation is defined as noise on the output LOW level that exceeds V IL limits, or on output HIGH levels that exceed VIH limits. The input HIGH voltage level at which oscillation occurs is defined as V IHD. * Verify that the GND reference recorded on the oscilloscope has not drifted to ensure the accuracy and repeatability of the measurements.
Note A: VOHV and VOLP are measured with respect to ground reference. Note B: Input pulses have the following characteristics: f = 1 MHz, tr = 3 ns, tf = 3 ns, skew < 150 ps.
FIGURE 2. Quiet Output Noise Voltage Waveforms
FIGURE 3. Simultaneous Switching Test Circuit
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74ACTQ652
Physical Dimensions inches (millimeters) unless otherwise noted
24-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-013, 0.300 Wide Package Number M24B
7
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74ACTQ652
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
24-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide Package Number MTC24
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8
74ACTQ652 Quiet Series Transceiver/Register
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
24-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N24C
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. 9 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com
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