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74F74 Dual D-Type Positive Edge-Triggered Flip-Flop
April 1988 Revised July 1999
74F74 Dual D-Type Positive Edge-Triggered Flip-Flop
General Description
The F74 is a dual D-type flip-flop with Direct Clear and Set inputs and complementary (Q, Q) outputs. Information at the input is transferred to the outputs on the positive edge of the clock pulse. Clock triggering occurs at a voltage level of the clock pulse and is not directly related to the transition time of the positive-going pulse. After the Clock Pulse input threshold voltage has been passed, the Data input is locked out and information present will not be transferred to the outputs until the next rising edge of the Clock Pulse input. Asynchronous Inputs: LOW input to SD sets Q to HIGH level LOW input to CD sets Q to LOW level Clear and Set are independent of clock Simultaneous LOW on CD and SD makes both Q and Q HIGH
Ordering Code:
Order Number 74F74SC 74F74SJ 74F74PC Package Number M14A M14D N14A Package Description 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter "X" to the ordering code.
Logic Symbols
Connection Diagram
IEEE/IEC
(c) 1999 Fairchild Semiconductor Corporation
DS009469
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74F74
Unit Loading/Fan Out
U.L. Pin Names D1 , D2 CP1, CP2 CD1, CD2 SD1, SD2 Q1, Q1, Q2, Q2 Data Inputs Clock Pulse Inputs (Active Rising Edge) Direct Clear Inputs (Active LOW) Direct Set Inputs (Active LOW) Outputs Description HIGH/LOW 1.0/1.0 1.0/1.0 1.0/3.0 1.0/3.0 50/33.3 Input IIH/IIL Output IOH/IOL 20 A/-0.6 mA 20 A/-0.6 mA 20 A/-1.8 mA 20 A/-1.8 mA -1 mA/20 mA
Truth Table
Inputs SD L H L H H H
H (h) = HIGH Voltage Level L (l) = LOW Voltage Level X = Immaterial Q 0 = Previous Q (Q) before LOW-to-HIGH Clock Transition Lower case letters indicate the state of the referenced input or output one setup time prior to the LOW-to-HIGH clock transition.
Outputs CP X X D X X X h l X Q H L H H L Q0 Q L H H L H Q0
CD H L L H H H

L
X
Logic Diagram
Please note that this diagram is provided only for the understanding of logic operations and should not be used to estimate propagation delays.
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74F74
Absolute Maximum Ratings(Note 1)
Storage Temperature Ambient Temperature under Bias Junction Temperature under Bias VCC Pin Potential to Ground Pin Input Voltage (Note 2) Input Current (Note 2) Voltage Applied to Output in HIGH State (with VCC = 0V) Standard Output 3-STATE Output Current Applied to Output in LOW State (Max) ESD Last Passing Voltage (Min) twice the rated IOL (mA) 4000V -0.5V to VCC -0.5V to +5.5V -65C to +150C -55C to +125C -55C to +150C -0.5V to +7.0V -0.5V to +7.0V -30 mA to +5.0 mA
Recommended Operating Conditions
Free Air Ambient Temperature Supply Voltage 0C to +70C +4.5V to +5.5V
Note 1: Absolute maximum ratings are values beyond which the device may be damaged or have its useful life impaired. Functional operation under these conditions is not implied. Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Symbol VIH VIL VCD VOH VOL IIH IBVI ICEX VID IOD IIL IOS ICC Parameter Input HIGH Voltage Input LOW Voltage Input Clamp Diode Voltage Output HIGH Voltage Output LOW Voltage Input HIGH Current Input HIGH Current Breakdown Test Output HIGH Leakage Current Input Leakage Test Output Leakage Circuit Current Input LOW Current -60 10.5 4.75 3.75 -0.6 -1.8 Output Short-Circuit Current Power Supply Current -150 16.0 5.0 7.0 50 A A A V A mA mA mA Max Max Max 0.0 0.0 VIN = 2.7V VIN = 7.0V VOUT = VCC IID = 1.9 A All Other Pins Grounded VIOD = 150 mV All Other Pins Grounded VIN = 0.5V (D, CP) VIN = 0.5V (CD, SD) VOUT = 0V 10% VCC 5% VCC 10% VCC 2.5 2.7 0.5 Min 2.0 0.8 -1.2 Typ Max Units V V V V V Min Min Min VCC Conditions Recognized as a HIGH Signal Recognized as a LOW Signal IIN = -18 mA IOH = -1 mA IOH = -1 mA IOL = 20 mA
Max Max Max
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74F74
AC Electrical Characteristics
TA = +25C Symbol Parameter Min fMAX tPLH tPHL tPLH tPHL Maximum Clock Frequency Propagation Delay CPn to Qn or Qn Propagation Delay CDn or SDn to Qn or Qn 100 3.8 4.4 3.2 3.5 VCC = +5.0V CL = 50 pF Typ 125 5.3 6.2 4.6 7.0 6.8 8.0 6.1 9.0 Max TA = 0C to +70C VCC = +5.0V CL = 50 pF Min 100 3.8 4.4 3.2 3.5 7.8 9.2 7.1 10.5 Max MHz ns Units
ns
AC Operating Requirements
TA = +25C Symbol Parameter VCC = +5.0V Min tS(H) tS(L) tH(H) tH(L) tW(H) tW(L) tW(L) tREC Setup Time, HIGH or LOW Dn to CPn Hold Time, HIGH or LOW Dn to CPn CPn Pulse Width HIGH or LOW CDn or SDn Pulse Width LOW Recovery Time CDn or SDn to CP 2.0 2.0 ns 2.0 3.0 1.0 1.0 4.0 5.0 4.0 Max TA = 0C to +70C VCC = +5.0V Min 2.0 3.0 1.0 1.0 4.0 5.0 4.0 ns ns ns Max Units
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74F74
Physical Dimensions inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-120, 0.150 Narrow Package Number M14A
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide Package Number M14D
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74F74 Dual D-Type Positive Edge-Triggered Flip-Flop
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300 Wide Package Number N14A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and Fairchild reserves the right at any time without notice to change said circuitry and specifications. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain life, and (c) whose failure to perform when properly used in accordance with instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the user. www.fairchildsemi.com 6 2. A critical component in any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. www.fairchildsemi.com

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