| PART |
Description |
Maker |
| HMC187AMS8E |
Test Equipment
|
Analog Devices
|
| C5410 |
Base Stations Test Equipment Switching
|
Vectron International, Inc
|
| DK-2371 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL EQUIPMENT (IECEE) CB SCHEME
|
SL Power Electronics
|
| TLP173A TLP173ATPLF |
Telecommunications Control Equipment Data Acquisition System Security Equipment Measurement Equipment
TRANSISTOR OUTPUT SOLID STATE RELAY, 3750 V ISOLATION-MAX
|
Toshiba Semiconductor
|
| AD7884AAP AD7884ABP AD7884AQ AD7884BQ AD7884JQ AD7 |
0.3-7V; 1000mW; LC2MOS 16-bit, high speed sampling ADC. For automatic test equipment, medical instrumentation, industrial control, data acquisition systems, robotics
|
Analog Devices
|
| P5W |
Application for Telecommunication Equipment,Office Equipment,Security Alarm Systems
|
DB Lectro Inc
|
| HMC204 |
Test Equipment
|
Micross Components
|
| TLP4007G |
Telecommunication Measurement Equipment Security Equipment FA
|
Toshiba Semiconductor
|
| TLP4222G TLP4222G-2 |
Telecommunication Measurement Equipment Security Equipment FA
|
Toshiba Semiconductor
|
| TLP4027G07 TLP4027G |
Telecommunication Measurement Equipment Security Equipment FA
|
Toshiba Semiconductor
|
| 0040.1031 0040.1032 0040.1033 0040.1034 0040.1035 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
