PART |
Description |
Maker |
50PMA-012 |
TRANSCEIVER TEST SYSTEM
|
JFW Industries, Inc.
|
IT3M-200S-BGA IT3D-200S-BGA IT3D-300S-BGA IT3M-300 |
IT3 Test Vehicle Assembly Yield Test
|
Hirose Electric
|
DTS-1600A |
Dielectric Test System
|
Directed Energy
|
50PA-560 |
HANDOVER TEST SYSTEM
|
JFW Industries, Inc.
|
MC33390 ON1047 |
Class B Serlal Llnk Transceiver J-1850 SERIAL LINK TRANSCEIVER From old datasheet system
|
Motorola ON Semi
|
L4411A |
Leading the Industry in High-Performance System Test
|
Agilent(Hewlett-Packard)
|
AT86RF210 |
The AT86RF210 Z-Link?Transceiver is an 868/915 MHz direct sequence spread spectrum BPSK transceiver designed for IEEE 802.15.4/ZigBee?based systems; supports data rates of 20 kbps and 40 kbps, respectively. Z-LINK TRANSCEIVER From old datasheet system
|
ATMEL Corporation
|
US-TUVR-4428 |
IEC SYSTEM FOR MUTUAL RECOGNITION OF TEST CERTIFICATES FOR ELECTRICAL...
|
SL Power Electronics
|
BA7024 A5800785 |
Video signal switcher with test pattern generator From old datasheet system
|
ROHM
|
CBL-SERIES CBL-2FT-NMNM CBL-2FT-SMNM CBL-2FT-SMSM |
From old datasheet system Coaxial-Flex Test Cables 50з DC to 18 GHz
|
MINI[Mini-Circuits]
|
IDT59910A IDT59910A-7SOI IDT59910A-2SO IDT59910A-2 |
LOW SKEW PLL CLOCK DRIVER TURBOCLOCK JR. PLL BASED CLOCK DRIVER, 8 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PDSO24 Scan Test Devices With 18-Bit Universal Bus Transceiver 64-LQFP -40 to 85 Scan Test Devices With 18-Bit Bus Transceivers 56-SSOP -40 to 85 LOW SKEW PLL CLOCK DRIVER TURBOCLOCK? JR.
|
Kycon, Inc. Integrated Device Technology, Inc. IDT[Integrated Device Technology]
|
IDT5V991A-2JG IDT5V991A-2JI IDT5V991A-5J IDT5V991A |
3.3V PROGRAMMABLE SKEW PLL CLOCK DRIVER TURBOCLOCK 5V SERIES, PLL BASED CLOCK DRIVER, 8 TRUE OUTPUT(S), 0 INVERTED OUTPUT(S), PQCC32 Scan Test Devices With 18-Bit Inverting Bus Transceivers 56-SSOP -40 to 85 Scan Test Devices With 20-Bit Universal Bus Transceivers 64-LQFP -40 to 85 From old datasheet system
|
Integrated Device Technology, Inc. IDT[Integrated Device Technology]
|