| PART |
Description |
Maker |
| AD5522 AD552208 |
Quad Parametric Measurement Unit with Integrated 16-Bit Level Setting DACs
|
Analog Devices
|
| AD5520JSTZ-REEL AD5520JST-REEL |
Per Pin Parametric Measurement Unit/Source Measure Unit
Per Pin Parametric Measurement Unit/Source Measure Unit
|
Analog Devices
|
| AD5520JST AD5520JST-REEL |
Per-pin Parametric Measurement Unit / Source Measure Unit
|
Analog Devices
|
| TLP202A-14 |
Telecommunications Measurement and Control Equipment Data Acquisition System Measurement Equipment
|
Toshiba Semiconductor
|
| N9201A |
Array Structure Parametric Test Option
|
Agilent(Hewlett-Packard)
|
| ML925J11F ML920AA11S ML920J11S ML920L11S ML925AA11 |
Notice : Some parametric limits are subject to change InGaAsP DFB LASER DIODES 请注意：某些参数的限制可能会有所变化InGaAsP的DFB激光器
|
Mitsubishi Electric, Corp.
Mitsubishi Electric Corporation
MITSUBISHI[Mitsubishi Electric Semiconductor]
|
| AT49BV002AT AT49BV002ANT |
256K x 8 (2M bit), 2.7-Volt Read and 2.7-Volt Write, Top Boot Parametric Block Flash.
|
Atmel
|
| TLP4206G |
Photocoupler Photorelay
PBX TELECOMMUNICATION MODEMテAX CARDS, MODEMS IN PC MEASUREMENT INSTRUMENTATION
PBX Telecommunication Modem?AX Cards, Modems In PC Measurement Instrumentation
|
Toshiba Semiconductor
|
| CD4043BMS CD4043BMSH CD4044BMS CD4044BMSH FN3311 C |
Single 100Mbps Digital Isolator with Enable 8-SOIC -40 to 125
CMOS Quad Clocked “DLatch
R/S Latches, Tri-State, Quad, Rad-Hard, CMOS, Logic
CMOS Quad Clocked “D” Latch
From old datasheet system
CMOS Quad 3 State R/S Latches
CMOS Quad Clocked D Latch
CMOS Quad Clocked “D Latch
|
INTERSIL[Intersil Corporation]
|
| B57861S0103040 B57861S0104040 B57861S0202 B57861S0 |
Temperature Measurement
|
EPCOS
|
