| PART |
Description |
Maker |
| ZC40 ZC40A ZC25 ZC20 ZC25A ZC20A ZC30A |
Flow Switch Tester
|
Systemsensor advanced ideas.
|
| ZCK-50 ZCK-1 |
Zonecheck Keyswitch for Control and Monitoring of the Zonecheck Flow Switch Tester
|
Systemsensor advanced ideas.
|
| CY7C1483V33-100BGC CY7C1483V33-117BGC CY7C1483V33- |
IC, SDRAM, 64M BIT, 512KX4X32 BIT,3.3V,10NS,100MHZ,TSOP-86
2M x 36/4M x 18/1M x 72 Flow-through SRAM 4M X 18 STANDARD SRAM, 7.5 ns, PQFP100
2M x 36/4M x 18/1M x 72 Flow-through SRAM 1M X 72 CACHE SRAM, 6.5 ns, PBGA209
2M x 36/4M x 18/1M x 72 Flow-through SRAM 1M X 72 STANDARD SRAM, 7.5 ns, PBGA209
2M x 36/4M x 18/1M x 72 Flow-through SRAM 4M X 18 STANDARD SRAM, 7.5 ns, PBGA165
2M x 36/4M x 18/1M x 72 Flow-through SRAM 4M X 18 STANDARD SRAM, 6.5 ns, PQFP100
2M x 36/4M x 18/1M x 72 Flow-through SRAM 2M X 36 STANDARD SRAM, 8.5 ns, PQFP100
2M x 36/4M x 18/1M x 72 Flow-through SRAM 4M X 18 STANDARD SRAM, 8.5 ns, PQFP100
2M x 36/4M x 18/1M x 72 Flow-through SRAM 1M X 72 STANDARD SRAM, 5.5 ns, PBGA209
|
Cypress Semiconductor Corp.
Cypress Semiconductor, Corp.
|
| QS3VH16861PA8 |
2.5V/3.3V 20-Bit Flow-Through Pin Out, High Bandwidth Bus Switch
|
IDT
|
| 17572 17572-G |
HTSNK. B X-FLOW. .9H LOW FLOW. THRU HOLE HTSNKB型X流0.9 低流量。通孔
|
Vicor, Corp.
VICOR[Vicor Corporation]
|
| 17510-6 17510 |
HTSNK, A X-FLOW, .4H LOW FLOW, THREADED
|
VICOR[Vicor Corporation]
|
| AS7C33256FT32_36A AS7C33256FT32_36A.V1.1 AS7C33256 |
3.3V 256K x 32/36 Flow-through synchronous SRAM 256K X 32 STANDARD SRAM, 8.5 ns, PQFP100
3.3V 256K x 32/36 Flow-through synchronous SRAM 256K X 36 STANDARD SRAM, 7.5 ns, PQFP100
3.3V 256K x 32/36 Flow-through synchronous SRAM 256K X 32 STANDARD SRAM, 7.5 ns, PQFP100
3.3V 256K x 32/36 Flow-through synchronous SRAM 256K X 32 STANDARD SRAM, 10 ns, PQFP100
DIODE ZENER SINGLE 1000mW 24Vz 10.5mA-Izt 0.05 5uA-Ir 18.2Vr DO41-GLASS 5K/AMMO
From old datasheet system
Sync SRAM - 3.3V
|
Alliance Semiconductor, Corp.
Alliance Semiconductor Corporation
ALSC
|
| A-1865-06311-UNILAPISO5KV |
INSULATION TESTER 5KV 5kV的绝缘测试仪
|
Bourns, Inc.
|
| DS2172 DS2172T DS2172TN |
Bit Error Rate Tester BERT
|
MAXIM - Dallas Semiconductor
Dallas Semiconducotr
DALLAS[Dallas Semiconductor]
|
| SE-100T |
The tester injects current through the window of installed
|
Littelfuse
|
| DS21372 |
3.3V Bit Error Rate Tester (BERT)
|
MAXIM - Dallas Semiconductor
|
| 130127-0009 |
Super-Safeway? 3-Wire Circuit Tester
|
Molex Electronics Ltd.
|
