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AD[Analog Devices] Analog Devices, Inc.
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| Part No. |
3B18 3B18-02 3B18-00 3B18-01 3B18-CUSTOM 3B18-15
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| OCR Text |
...protects the computer side from damage due to field-side over-voltage faults up to 130V rms. In addition, the current output withstands 130V rms without damage and interfaces user equipment through screw terminals located on the 3B Series b... |
| Description |
Non-Isolated Strain Gage Input; 20 kHz Bandwidth Signal Conditioning Module Wide Bandwidth Strain Gage Input From old datasheet system
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| File Size |
329.12K /
8 Page |
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| Part No. |
DAC908
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| OCR Text |
...stallation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause t... |
| Description |
From old datasheet system
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| File Size |
471.01K /
17 Page |
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| Part No. |
DDC112
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| OCR Text |
...um Ratings" may cause permanent damage to the device. Exposure to absolute maximum conditions for extended periods may affect device reliability.
14 15 16 17 18 19 20 21 22 23 24 25 26
ELECTROSTATIC DISCHARGE SENSITIVITY
This integra... |
| Description |
From old datasheet system
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| File Size |
237.01K /
24 Page |
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| Part No. |
DRV104
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| OCR Text |
...ese ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may degrade device reliability. (2) See the Bypass section for discussion about operating near the maximum supply. (3) Higher voltage may b... |
| Description |
From old datasheet system
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| File Size |
347.05K /
19 Page |
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it Online |
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| Part No. |
DRV594
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| OCR Text |
...stallation procedures can cause damage. ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause t... |
| Description |
From old datasheet system
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| File Size |
119.63K /
20 Page |
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it Online |
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| Part No. |
E411107
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| OCR Text |
...9
7
8
Permanent device damage may occur if the above Absolute Maximum Ratings are exceeded. Functional operation should be restricted to the conditions as detailed in the operational sections of this data sheet. Exposure to absolut... |
| Description |
From old datasheet system
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| File Size |
85.07K /
7 Page |
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it Online |
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| Part No. |
E411108
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| OCR Text |
... Power Supply. Permanent device damage may occur if the above Absolute Maximum Ratings are exceeded. Functional operation should be restricted to the conditions as detailed in the operational sections of this data sheet. Exposure to absolut... |
| Description |
From old datasheet system
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| File Size |
78.31K /
7 Page |
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it Online |
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| Part No. |
E412104
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| OCR Text |
...y to protect the inputs against damage due to high static voltages or electric fields. However, it is advised that normal precautions be taken to avoid application of any voltage higher than maximum rated voltages to this high impedance cir... |
| Description |
From old datasheet system
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| File Size |
104.14K /
8 Page |
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it Online |
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