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For tests Found Datasheets File :: 18992    Search Time::1.343ms    
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    PTCCL05H131EYE PTCCL05H181DYE PTCCL05H271DYE PTCCL05H940EYE PTCCL07H321DYE PTCCL07H411DYE PTCCL09H471DYE PTCCL09H541DYE

Vishay Siliconix
Part No. PTCCL05H131EYE PTCCL05H181DYE PTCCL05H271DYE PTCCL05H940EYE PTCCL07H321DYE PTCCL07H411DYE PTCCL09H471DYE PTCCL09H541DYE PTCCL11H611DYE PTCCL11H701DYE PTCCL13H831DYE PTCCL13H921DYE PTCCL17H112DBE PTCCL17H132DBE PTCCL21H172DBE PTCCL21H202DBE 238166351321 238166452021 238166451721 2381660X1311 2381660X1811 2381660X2711 2381660X491 2381660X9491 2381661X3211 2381661X4111 2381661X4711 2381661X5411 2381662X6111 2381662X7011 2381662X8311 2381662X9211 238166351121
OCR Text ...test programs * Long-life cycle tests (over 5000 trip cycles) * Long-life storage tests (3000 hours at 250 C) * Electrical cycle tests at low ambient temperatures (- 40 C or 0 C) * Damp-heat and water immersion tests * Overvoltage tests at ...
Description    30 to 60 V PTC Thermistors For Overload Protection

File Size 512.28K  /  6 Page

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    SAPM01N

Sanken electric
Part No. SAPM01N
OCR Text ...g methods during Characteristic tests, please observe the following cautions. (1) Cautions for Storage Ensure that storage conditions comply with the standard temperature (5 to 35) and the standard relative humidity (around 40 to 75%) and a...
Description silicon power MOSFET

File Size 356.02K  /  10 Page

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    4MBI75T-060

Fuji Electric
Part No. 4MBI75T-060
OCR Text ... 6 1 2 3 4 Environment tests 5 Range of frequency : 10 ~ 500Hz Sweeping time : 15 min. Acceleration : 100m/s2 Sweeping direction : Each X,Y,Z axis Test time : 6 hr. (2hr./direction) Shock Maximum acceleration 5000m/s2 : Pulse...
Description IGBT Module

File Size 623.18K  /  14 Page

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    74F161A I74F161AD I74F161AN N74F161AD N74F161AN 74F163A I74F163AD I74F163AN N74F163AD N74F163AN

NXP Semiconductors
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PHILIPS[Philips Semiconductors]
Part No. 74F161A I74F161AD I74F161AN N74F161AD N74F161AN 74F163A I74F163AD I74F163AN N74F163AD N74F163AN
OCR Text ...lid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 1996 Jan 29 7 Philips Semiconductors Product specification 4-bit binary counters 74F161A, 74F163A AC ELECTRI...
Description 4-bit binary counter

File Size 111.89K  /  14 Page

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    74F241 74F241A N74F241AD N74F241AN N74F241D N74F241N 74F240 74F240A N74F240AD N74F240AN N74F240D N74F240DB N74F240N

NXP Semiconductors
PHILIPS[Philips Semiconductors]
Part No. 74F241 74F241A N74F241AD N74F241AN N74F241D N74F241N 74F240 74F240A N74F240AD N74F240AN N74F240D N74F240DB N74F240N
OCR Text ...lid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. January 2, 1991 6 Philips Semiconductors Product specification Buffers 74F240/74F240A/ 74F241/74F241A AC ELE...
Description Octal inverter buffer 3-State

File Size 103.70K  /  12 Page

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    EL7232C EL7232CS

Elantec Semiconductor
Part No. EL7232C EL7232CS
OCR Text ...lantec performs most electrical tests using modern high-speed automatic test equipment specifically the LTX77 Series system Unless otherwise noted all tests are pulsed tests therefore TJ e TC e TA Test Level I II III IV V Test Procedure 100...
Description Dual Channel, High Speed, High Current Line Driver w/3-State

File Size 197.81K  /  8 Page

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    MACP-010718-CG09E0-V2

M/A-COM Technology Solutions, Inc.
Part No. MACP-010718-CG09E0-V2
OCR Text ...ormance is based on engineering tests. specifications are typical. mechanical outline has been fixed. engineering samples and/or test data may be available. commitment to produce in volume is not guaranteed. parameter conditions uni...
Description Coupler, 17dB

File Size 716.53K  /  4 Page

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