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| Part No. |
ATJ331X
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| OCR Text |
...ign defects or errors known as anomalies or errata which may cause the products functions to deviate from published specifications. anomaly or ?errata? sheets relating to currently characte rized anomalies or errata are available upon r... |
| Description |
third generation single-chip highly integrated digital music system solution
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| File Size |
1,033.64K /
117 Page |
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Mavrix
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| Part No. |
MV6601C
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| OCR Text |
...sign defects or errors known as anomalies or errata which may cause the products functions to deviate from published specifications. anomaly or errata sheets relating to currently characterized anomalies or errata are available upon r... |
| Description |
multi-core processor
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| File Size |
855.31K /
48 Page |
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CREE POWER
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| Part No. |
W4NRD0X-0000 W4NRD8C-U000 W4NXD8C-0000 W4NXD8C-L000 W4NXD8D-0000 W4NXD8C-S000 W4NXD8D-S000 W4NXD8G-0000 W6NRE0X-0000 W6NRD0X-0000 W6PXD3O-0000 W6NXD3L-0000 W6NXD0K-0000 W6NXD3K-0000
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| OCR Text |
...ividual distinguishable surface anomalies, which appears as a depression in the wafer surface with a length-to-width ratio less than 5 to 1, and visible under high intensity illumination. foreign polytypes (also referred to as ?inclusions?... |
| Description |
Diameter: 50.8mm; LCW substrates; silicon carbide substrates. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
Diameter: 50.8mm; ultra-low mircopipe density; silicon carbide substrates. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
Diameter: 50.8mm; standatd mircopipe density; silicon carbide substrates. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
Diameter: 50.8mm; low mircopipe density; silicon carbide substrates. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
Diameter: 50.8mm; select mircopipe density; silicon carbide substrates. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
Diameter: 76.2mm; LCW type; 6H-silicon carbide. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
Diameter: 50.8mm; LCW type; 6H-silicon carbide. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
Diameter: 50.8mm; lsemi-insulating (prototype); 6H-silicon carbide. For high frequency power devices, high power devices, high temperature devices, optoelectronic devices, III-V nitride deposition
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| File Size |
273.34K /
17 Page |
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| Part No. |
ATJ2091H
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| OCR Text |
...sign defects or errors known as anomalies or errata which may cause the products functions to deviate from published specifications. Anomaly or "errata" sheets relating to currently characterized anomalies or errata are available upon reque... |
| Description |
ATJ2091H
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| File Size |
308.02K /
31 Page |
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Keysight Technologies
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| Part No. |
33512B
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| OCR Text |
...hance of missing short-duration anomalies that are critical for testing device reliability. waveform sequencing waveform sequencing lets you create multiple configured waveforms with several common segments and lets you build long, compl... |
| Description |
Waveform Generators
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| File Size |
6,317.01K /
23 Page |
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Keysight Technologies
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| Part No. |
DSOX4CXPI
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| OCR Text |
...ents-in-1. experience the speed anomalies and elusive events are the toughest to debug. the 4000 x-series oscilloscope redefines your debugging experience with megazoom iv smart memory technology. the industry- leading 1-million-waveforms... |
| Description |
InfiniiVision 4000 X-Series Oscilloscopes
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| File Size |
4,282.65K /
39 Page |
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