| |
|
 |
Fairchild Semiconductor Corporation
|
| Part No. |
SCANPSC110FSC
|
| OCR Text |
...ombined serially. addressing is accomplished by load- ing the instruction register with a value matching that of the slot inputs. backplane and inter-board testing can easily be accomplished by parking the local tap controllers in one of th... |
| Description |
SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
|
| File Size |
276.96K /
25 Page |
 View
it Online |
Download Datasheet
|
| |
|
|
Electronic Theatre Controls, Inc.
|
| Part No. |
AN-24
|
| OCR Text |
...volts. the bias current test is accomplished by allowing the device under test to draw input current to one of its inputs through the corresponding input resistor on positive going or nega- tive going halves of the triangular wave generator... |
| Description |
A Simplified Test Set for Op Amp Characterization
|
| File Size |
412.91K /
10 Page |
View
it Online |
Download Datasheet |
| |
|
|
Vitesse Semiconductor C...
Vitesse Semiconductor Corporation.
|
| Part No. |
VSC837
|
| OCR Text |
...the channels. power-down can be accomplished in hardware, via dedicated power pins for pairs of input and output channels, or in software by programming individual unused outputs with a disable code. vsc837 block diagram 68 input by 68 ... |
| Description |
3.2Gb/s 68x68 Crosspoint Switch
|
| File Size |
344.13K /
26 Page |
View
it Online |
Download Datasheet |
|
Price and Availability
|
