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				INTERSIL[Intersil Corporation]
Part No.	ACTS10K ACTS10KMSR ACTS10HMSR FN3631 ACTS10DMSR ACTS10MS ACTS10D
OCR Text	...ROUPS Initial Test (Preburn-In) interim Test 1 (Postburn-In) interim Test 2 (Postburn-In) PDA interim Test 3 (Postburn-In) PDA Final Test Group A (Note 1) Group B Group D NOTE: 1. Alternate Group A testing may be exercised in accordance wit...
Description	From old datasheet system Radiation Hardened Triple Three-Input NAND Gate
File Size	111.24K / 8 Page	View it Online	Download Datasheet

				INTERSIL[Intersil Corporation]
Part No.	CD40257BMS FN3364 CD4025
OCR Text	...ROUP Initial Test (Pre Burn-In) interim Test 1 (Post Burn-In) interim Test 2 (Post Burn-In) PDA (Note 1) interim Test 3 (Post Burn-In) PDA (Note 1) Final Test Group A Group B Subgroup B-5 Subgroup B-6 Group D MIL-STD-883 METHOD 100% 5004 10...
Description	From old datasheet system CMOS Quad 2 Line to 1 Line Data Selector/Multiplexer
File Size	58.96K / 8 Page	View it Online	Download Datasheet

				INTERSIL[Intersil Corporation]
Part No.	ACS10K ACS10KMSR FN3630 ACS10MS ACS10D ACS10DMSR ACS10HMSR
OCR Text	...ROUPS Initial Test (Preburn-In) interim Test 1 (Postburn-In) interim Test 2 (Postburn-In) PDA interim Test 3 (Postburn-In) PDA Final Test Group A (Note 1) Group B Group D NOTE: 1. Alternate Group A testing may be exercised in accordance wit...
Description	Radiation Hardened Triple Three-Input NAND Gate From old datasheet system
File Size	105.18K / 8 Page	View it Online	Download Datasheet

				INTERSIL[Intersil Corporation] Intersil, Corp.
Part No.	HCTS4002MS FN3075 HCTS4002D HCTS4002DMSR HCTS4002HMSR HCTS4002K HCTS4002KMSR HCTS374KTR
OCR Text	...ROUPS Initial Test (Preburn-In) interim Test I (Postburn-In) interim Test II (Postburn-In) PDA interim Test III (Postburn-In) PDA Final Test Group A (Note 1) Group B Subgroup B-5 Subgroup B-6 Group D NOTE: 1. Alternate Group A Inspection in...
Description	From old datasheet system Radiation Hardened Octal D-Type Flip-Flop/ Three-State/ Positive Edge Triggered Radiation Hardened Dual 4-Input NOR Gate HCT SERIES, DUAL 4-INPUT NOR GATE, CDIP14 Quadruple 2-Input Positive-NAND Gates 14-CDIP -55 to 125 HCT SERIES, DUAL 4-INPUT NOR GATE, CDFP14
File Size	124.65K / 9 Page	View it Online	Download Datasheet

				Intersil
Part No.	HCTS7266MS FN3384
OCR Text	...ROUPS Initial Test (Preburn-In) interim Test I (Postburn-In) interim Test II (Postburn-In) PDA interim Test III (Postburn-In) PDA Final Test Group A (Note 1) Group B Subgroup B-5 Subgroup B-6 Group D NOTE: 1. Alternate Group A in accordance...
Description	Radiation Hardened Quad 2-Input Exclusive NOR Gate From old datasheet system
File Size	132.47K / 9 Page	View it Online	Download Datasheet

				INTERSIL[Intersil Corporation]
Part No.	HCTS540MS HCTS540 HCTS540D HCTS540DMSR HCTS540HMSR HCTS540K HCTS540KMSR
OCR Text	...ROUPS Initial Test (Preburn-In) interim Test I (Postburn-In) interim Test II (Postburn-In) PDA interim Test III (Postburn-In) PDA Final Test Group A (Note 1) Group B Subgroup B-5 Subgroup B-6 Group D NOTES: 1. Alternate Group A testing in a...
Description	Radiation Hardened Inverting Octal Buffer/Line Driver, Three-State Quadruple 2-Input Positive-NOR Gates 20-LCCC -55 to 125
File Size	134.61K / 10 Page	View it Online	Download Datasheet

				Intersil Corporation
Part No.	CD4066
OCR Text	...ROUP Initial Test (Pre Burn-In) interim Test 1 (Post Burn-In) interim Test 2 (Post Burn-In) PDA (Note 1) interim Test 3 (Post Burn-In) PDA (Note 1) MIL-STD-883 METHOD 100% 5004 100% 5004 100% 5004 100% 5004 100% 5004 100% 5004 GROUP A SUBGR...
Description	CMOS 4-Bit Magnitude Comparator
File Size	80.00K / 9 Page	View it Online	Download Datasheet

				Intersil Corporation
Part No.	CD4072
OCR Text	...ROUP Initial Test (Pre Burn-In) interim Test 1 (Post Burn-In) interim Test 2 (Post Burn-In) PDA (Note 1) interim Test 3 (Post Burn-In) PDA (Note 1) Final Test Group A MIL-STD-883 METHOD 100% 5004 100% 5004 100% 5004 100% 5004 100% 5004 100%...
Description	CMOS OR Gate
File Size	92.09K / 10 Page	View it Online	Download Datasheet

				Everlight Electronics Co., Ltd.
Part No.	RTSX32SU-1CQ208B
OCR Text	...25c or 80 hours at 150c 100% 9. interim (post-burn-in) electrical parameters in accordance with applicable actel device specification 100% 10. percent defective allowable 5% all lots 11. final electrical test a. static tests (1)25c (subgro...
Description	FPGA, 2880 CLBS, 48000 GATES, CQFP208 CERAMIC, QFP-208
File Size	583.55K / 80 Page	View it Online	Download Datasheet

For interim Found Datasheets File :: 1235 Search Time::1.313ms
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