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| Part No. |
MAX3804EVKIT
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| OCR Text |
...plies normally causes permanent damage to laboratory test equipment (typical oscilloscope, BERT). The MAX3804 EV kit must be operated from a negative VEE supply when DC-coupled to normal laboratory equipment. 1) Connect a -3.3V power supply... |
| Description |
From old datasheet system
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| File Size |
207.73K /
5 Page |
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| Part No. |
MC14513BCP
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| OCR Text |
...y to protect the inputs against damage due to high static voltages or electric fields. However, it is advised that normal precautions be taken to avoid application of any voltage higher than maximum rated voltages to this high- impedance ci... |
| Description |
From old datasheet system
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| File Size |
216.76K /
12 Page |
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it Online |
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| Part No. |
MSC1200Y2
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| OCR Text |
...um Ratings" may cause permanent damage to the device. Exposure to absolute-maximumrated conditions for extended periods may affect device reliability.
ELECTROSTATIC DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Te... |
| Description |
From old datasheet system
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| File Size |
208.69K /
11 Page |
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it Online |
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| Part No. |
MSC1210Y2
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| OCR Text |
...um Ratings" may cause permanent damage to the device. Exposure to absolute-maximumrated conditions for extended periods may affect device reliability.
ELECTROSTATIC DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Te... |
| Description |
From old datasheet system
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| File Size |
763.39K /
58 Page |
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it Online |
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| Part No. |
MSC1211
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| OCR Text |
...um Ratings" may cause permanent damage to the device. Exposure to absolute-maximumrated conditions for extended periods may affect device reliability.
ELECTROSTATIC DISCHARGE SENSITIVITY
This integrated circuit can be damaged by ESD. Te... |
| Description |
From old datasheet system
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| File Size |
1,097.72K /
68 Page |
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it Online |
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| Part No. |
NCP345
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| OCR Text |
...supply from the load before any damage can occur. The OVP consists of a precise voltage reference, a comparator with hysteresis, control logic, and a MOSFET gate driver. The OVP is designed on a robust BiCMOS process and is intended to with... |
| Description |
From old datasheet system
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| File Size |
64.60K /
8 Page |
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it Online |
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| Part No. |
NCP346-D
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| OCR Text |
...supply from the load before any damage can occur. The OVP consists of a precise voltage reference, a comparator with hysteresis, control logic, and a MOSFET gate driver. The OVP is designed on a robust BiCMOS process and is intended to with... |
| Description |
From old datasheet system
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| File Size |
336.31K /
16 Page |
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it Online |
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| Part No. |
NSC04558
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| OCR Text |
...gs indicate limits beyond which damage to the device may occur. DC and AC electrical specifications are not ensured when operating the device at absolute maximum ratings.
DC Electrical Characteristics 98xEK:
0C TA + 70C unless otherwi... |
| Description |
From old datasheet system
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| File Size |
557.40K /
46 Page |
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it Online |
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