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CDP1822D 56F83 75501VXC 1N991 1060CT HT82M23A 6209A TKDD30A
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    M/A-COM Technology Solu...
Part No. MADP042005 MADP042005-15
OCR Text ...ormance is based on engineering tests. specifications are typical. mechanical outline has been fixed. engineering samples and/or test data may be available. commitment to produce in volume is not guaranteed. features ?? surface mount ...
Description SURMOUNTTM PIN Diodes
SURMOUNT PIN Diodes

File Size 128.41K  /  4 Page

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    74F08 I74F08D I74F08N N74F08D N74F08N 74F08_2

PHILIPS[Philips Semiconductors]
NXP Semiconductors
Part No. 74F08 I74F08D I74F08N N74F08D N74F08N 74F08_2
OCR Text ...lid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. Supply current (total) 1995 Apr 19 3 Philips Semiconductors Product specification Quad 2-input AND gate 74F0...
Description From old datasheet system
Quad two-input AND gate

File Size 70.92K  /  8 Page

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    74F112 I74F112D I74F112N N74F112D N74F112N 74F112_2

NXP Semiconductors
PHILIPS[Philips Semiconductors]
Part No. 74F112 I74F112D I74F112N N74F112D N74F112N 74F112_2
OCR Text ...lid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 4. Measure ICC with the clock input grounded and all outputs open, with the Q and Q outputs High in turn. February 9, 1990 ...
Description From old datasheet system
Dual J-K negative edge-triggered flip-flop

File Size 84.00K  /  10 Page

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    74F1604 N74F1604D N74F1604N

NXP Semiconductors
PHILIPS[Philips Semiconductors]
Part No. 74F1604 N74F1604D N74F1604N
OCR Text ...lid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. October 4, 1990 4 Philips Semiconductors Product specification Latch 74F1604 AC ELECTRICAL CHARACTERISTICS LIMITS...
Description Latch

File Size 86.17K  /  10 Page

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    74F244 74F244B I74F244 I74F244D I74F244N N74F244BD N74F244BN N74F244D N74F244DB N74F244N

PHILIPS[Philips Semiconductors]
Part No. 74F244 74F244B I74F244 I74F244D I74F244N N74F244BD N74F244BN N74F244D N74F244DB N74F244N
OCR Text ...lid readings in other parameter tests. In any sequence of parameter tests, IOS tests should be performed last. 1994 Dec 5 5 Philips Semiconductors Product specification Octal buffers (3-State) 74F244/74F244B AC ELECTRIC...
Description Octal buffers 3-State
Octal buffers (3-State)

File Size 94.17K  /  12 Page

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    AC010A2200J6BCS AC010A2200JR1CS AC010A2201J6BCS AC010A2201J6FCS AC010A2200J6FCS AC010A2200JACCS AC010A2200JRBCS AC010A22

Vishay Siliconix
Part No. AC010A2200J6BCS AC010A2200JR1CS AC010A2201J6BCS AC010A2201J6FCS AC010A2200J6FCS AC010A2200JACCS AC010A2200JRBCS AC010A2201JACCS AC01-CS AC01-CS-18 AC05102200J6BCS AC05102200JACCS AC05102200JR1CS
OCR Text ...th at www.vishay.com/doc?91000 tests procedures and requirements all tests are carried out in accordance with the following specifications: ? iec 60115-1, generic specification (includes tests) the test and requirements table contains onl...
Description Axial Cemented Fusible Leaded Wirewound Safety Resistors

File Size 175.75K  /  9 Page

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    M/A-COM Technology Solu...
Part No. MABA-009412-CF1BC0
OCR Text ...ormance is based on engineering tests. specifications are typical. mechanical outline has been fixed. engineering samples and/or test data may be available. commitment to produce in volume is not guaranteed. features ? surface mount ?...
Description 1:1 Flux Coupled BalBal Transformer with separated center taps

File Size 97.99K  /  3 Page

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    M/A-COM Technology Solu...
Part No. MAALSS0034TR-3000
OCR Text ...ormance is based on engineering tests. specifications are typical. mechanical outline has been fixed. engineering samples and/or test data may be available. commitment to produce in volume is not guaranteed. features ? low noise figure...
Description Miniature Broadband Gain Stage 70 - 3000 MHz

File Size 144.28K  /  5 Page

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